| 2005 |
|---|
| 3 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application-specific worst case corners using response surfaces and statistical models.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(9): 1372-1380 (2005) |
| 2004 |
|---|
| 2 | EE | Manidip Sengupta,
Sharad Saxena,
Lidia Daldoss,
Glen Kramer,
Sean Minehane,
Jianjun Cheng:
Application Specific Worst Case Corners Using Response Surfaces and Statistical Models.
ISQED 2004: 351-356 |
| 2000 |
|---|
| 1 | EE | Sri Jandhyala,
Hari Balachandran,
Manidip Sengupta,
Anura P. Jayasumana:
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs.
VTS 2000: 444-452 |
