| 2006 |
|---|
| 3 | EE | Haldun Haznedar,
Martin Gall,
Vladimir Zolotov,
Pon Sung Ku,
Chanhee Oh,
Rajendran Panda:
Impact of stress-induced backflow on full-chip electromigration risk assessment.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1038-1046 (2006) |
| 2004 |
|---|
| 2 | EE | Chanhee Oh,
Haldun Haznedar,
Martin Gall,
Amir Grinshpon,
Vladimir Zolotov,
Pon Sung Ku,
Rajendran Panda:
A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification.
ISQED 2004: 232-237 |
| 1998 |
|---|
| 1 | EE | N. S. Nagaraj,
Frank Cano,
Haldun Haznedar,
Duane Young:
A Practical Approach to Static Signal Electromigration Analysis.
DAC 1998: 572-577 |
