| 2003 |
|---|
| 5 | EE | Darren Anand,
Bruce Cowan,
Owen Farnsworth,
Peter Jakobsen,
Steven F. Oakland,
Michael Ouellette,
Donald L. Wheater:
An On-Chip Self-Repair Calculation and Fusing Methodology.
IEEE Design & Test of Computers 20(5): 67-75 (2003) |
| 2002 |
|---|
| 4 | EE | Bruce Cowan,
Owen Farnsworth,
Peter Jakobsen,
Steven F. Oakland,
Michael Ouellette,
Donald L. Wheater:
On-Chip Repair and an ATE Independent Fusing Methodology.
ITC 2002: 178-186 |
| 3 | EE | Carl Barnhart,
Vanessa Brunkhorst,
Frank Distler,
Owen Farnsworth,
Andrew Ferko,
Brion L. Keller,
David Scott,
Bernd Könemann,
Takeshi Onodera:
Extending OPMISR beyond 10x Scan Test Efficiency.
IEEE Design & Test of Computers 19(5): 65-72 (2002) |
| 2001 |
|---|
| 2 | EE | Bernd Könemann,
Carl Barnhart,
Brion L. Keller,
Thomas J. Snethen,
Owen Farnsworth,
Donald L. Wheater:
A SmartBIST Variant with Guaranteed Encoding.
Asian Test Symposium 2001: 325- |
| 1 | | Carl Barnhart,
Vanessa Brunkhorst,
Frank Distler,
Owen Farnsworth,
Brion L. Keller,
Bernd Könemann,
Andrej Ferko:
OPMISR: the foundation for compressed ATPG vectors.
ITC 2001: 748-757 |
