| 2004 |
|---|
| 8 | EE | C. J. Clark,
Mike Ricchetti:
A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems.
ITC 2004: 857-866 |
| 2003 |
|---|
| 7 | EE | Bill Eklow,
Carl Barnhart,
Mike Ricchetti,
Terry Borroz:
IEEE 1149.6 - A Practical Perspective.
ITC 2003: 494-502 |
| 6 | EE | C. J. Clark,
Mike Ricchetti:
Infrastructure IP for Configuration and Test of Boards and Systems.
IEEE Design & Test of Computers 20(3): 78-87 (2003) |
| 2002 |
|---|
| 5 | EE | Fidel Muradali,
Mike Ricchetti,
Bart Vermeulen,
Bulent I. Dervisoglu,
Bob Gottlieb,
Bernd Koenemann,
C. J. Clark:
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?
VTS 2002: 445-446 |
| 4 | EE | Erik Jan Marinissen,
Rohit Kapur,
Maurice Lousberg,
Teresa L. McLaurin,
Mike Ricchetti,
Yervant Zorian:
On IEEE P1500's Standard for Embedded Core Test.
J. Electronic Testing 18(4-5): 365-383 (2002) |
| 2001 |
|---|
| 3 | EE | Dwayne Burek,
Garen Darbinyan,
Rohit Kapur,
Maurice Lousberg,
Teresa L. McLaurin,
Mike Ricchetti:
IP and Automation to Support IEEE P1500.
VTS 2001: 411-412 |
| 1998 |
|---|
| 2 | EE | Bulent I. Dervisoglu,
Mike Ricchetti,
William Eklow:
Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard.
ITC 1998: 980- |
| 1988 |
|---|
| 1 | | Mike Ricchetti,
John Hoglund:
Scan Diagnostic Strategy for the Series 10000 Prism Workstation.
ITC 1988: 987-992 |
