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Kenneth M. Butler

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2007
34EEMohammad Tehranipoor, Kenneth M. Butler: Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. IEEE Design & Test of Computers 24(3): 214-215 (2007)
33EENisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler: Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 896-906 (2007)
2006
32EEKenneth M. Butler: Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Design & Test of Computers 23(5): 388-389 (2006)
2004
31EEKenneth M. Butler: Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. ITC 2004: 1419
30EEKenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington: Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364
2003
29EEJayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger: A Case Study of IR-Drop in Structured At-Speed Testing. ITC 2003: 1098-1104
28EEKenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang: Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Design & Test of Computers 20(5): 6-7 (2003)
2002
27EEJayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech: Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129
26EEKenneth M. Butler: Is ITC Bored with Board Test? ITC 2002: 1237
25EEHari Balachandran, Kenneth M. Butler, Neil Simpson: Facilitating Rapid First Silicon Debug. ITC 2002: 628-637
2001
24 Frank F. Hsu, Kenneth M. Butler, Janak H. Patel: A case study on the implementation of the Illinois Scan Architecture. ITC 2001: 538-547
23 Jayashree Saxena, Kenneth M. Butler, Lee Whetsel: An analysis of power reduction techniques in scan testing. ITC 2001: 670-677
22EEJennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001)
2000
21 Jayashree Saxena, Kenneth M. Butler: An empirical study on the effects of test type ordering on overall test efficiency. ITC 2000: 408-416
20 Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler: Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC 2000: 729-738
1999
19 Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala: Expediting ramp-to-volume production. ITC 1999: 103-112
18 Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith: Correlation of logical failures to a suspect process step. ITC 1999: 458-476
17 Kenneth M. Butler: A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. ITC 1999: 839-847
16EEMichael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274
15EEKenneth M. Butler: Estimating the Economic Benefits of DFT. IEEE Design & Test of Computers 16(1): 71-79 (1999)
1998
14EEJayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess: On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757
1997
13 Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
12EEKenneth M. Butler: The stuck-at fault: it ain't over 'til it's over. ITC 1997: 1165
11EEKenneth M. Butler: Stuck-at fault: a fault model for the next millennium. ITC 1997: 1166
10 David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler: Bridging Fault Diagnosis in the Absence of Physical Information. ITC 1997: 887-893
9EEPhil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
8EEKenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena: Automated Diagnosis in Testing and Failure Analysis. IEEE Design & Test of Computers 14(3): 83-89 (1997)
1996
7 Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena: Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC 1996: 934
1995
6 Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell: Test Generation and Design for Test for a Large Multiprocessing DSP. ITC 1995: 149-156
5 Kenneth M. Butler: Deep Submicron: Is Test Up to the Challenge? ITC 1995: 923
1991
4EEKenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer: Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC 1991: 417-420
3EEDon E. Ross, Kenneth M. Butler, M. Ray Mercer: Exact ordered binary decision diagram size when representing classes of symmetric functions. J. Electronic Testing 2(3): 243-259 (1991)
1990
2EEKenneth M. Butler, M. Ray Mercer: The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design. DAC 1990: 673-678
1988
1EERhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler: CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. DAC 1988: 597-600

Coauthor Index

1Nisar Ahmed [33]
2Robert C. Aitken [9] [13]
3N. V. Arvind [29]
4Hari Balachandran [14] [16] [18] [19] [20] [25]
5Supatra Basu [27]
6John Berech [27]
7Stephanie Butler [18]
8David J. Campbell [27]
9Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng) [28]
10Brian Chess [10] [14]
11Jennifer Dworak [16] [22]
12F. Joel Ferguson [10] [14]
13Craig Force [18] [19]
14Tony Fryars [30]
15Rhonda Kay Gaede [1]
16Gordon Gammie [19]
17John Gatt [27]
18Michael R. Grimaila [16] [22]
19Manfred Hachinger [29]
20Graham Hetherington [6] [30]
21Bryan Houchins [16]
22Frank F. Hsu [24]
23Sri Jandhyala [19]
24Vinay B. Jayaram [29]
25Karl Johnson [7] [8]
26Anjali Jones [7]
27Rohit Kapur [4]
28Anjali Kinra [8]
29Sudheendra Phani Kumar [27]
30Subhendu Kundu [29]
31Fred Lakbani [20]
32Tracy Larrabee [10] [14]
33David B. Lavo [10] [14]
34Sooryong Lee [16] [22]
35Wojciech Maly [13]
36Vineet Mathur [16]
37Peter C. Maxwell [9] [13]
38M. Ray Mercer [1] [2] [3] [4] [16] [22]
39Wayne M. Needham [9] [13]
40Phil Nigh [9] [13]
41John W. Olson [19]
42Jaehong Park [16]
43Jason Parker [18] [19]
44Janak H. Patel [24]
45Jeff Platt [7] [8]
46Theo J. Powell [6]
47R. Raghuraman [27]
48C. P. Ravikumar [33]
49Don E. Ross [1] [3] [4]
50Jayashree Saxena [7] [8] [10] [14] [20] [21] [23] [27] [29] [30]
51Daniel Shupp [18]
52Neil Simpson [25]
53Jason Smith [18]
54Pravin Sreeprakash [29]
55Zoran Stanojevic [20]
56Bret Stewart [16] [22]
57Greg Sutton [6]
58Mohammad Tehranipoor [33] [34]
59D. M. H. Walker (Duncan M. Hank Walker) [20]
60Li-C. Wang [16] [22] [28]
61Lee Whetsel [23]
62Jason D. Wicker [22]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)