Bruce D. Cory
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2003
1
EE
Bruce D. Cory,
Rohit Kapur
,
Bill Underwood
: Speed Binning with Path Delay Test in 150-nm Technology.
IEEE Design & Test of Computers 20
(5): 41-45 (2003)
Coauthor
Index
1
Rohit Kapur
[
1
]
2
Bill Underwood
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)