| 2008 |
|---|
| 4 | EE | Selina Sha,
Bruce Swanson:
A Real Case of Significant Scan Test Cost Reduction.
ISVLSI 2008: 239-244 |
| 2006 |
|---|
| 3 | EE | Vlado Vorisek,
Bruce Swanson,
Kun-Han Tsai,
Dhiraj Goswami:
Improved Handling of False and Multicycle Paths in ATPG.
VTS 2006: 160-165 |
| 2003 |
|---|
| 2 | EE | Xijiang Lin,
Ron Press,
Janusz Rajski,
Paul Reuter,
Thomas Rinderknecht,
Bruce Swanson,
Nagesh Tamarapalli:
High-Frequency, At-Speed Scan Testing.
IEEE Design & Test of Computers 20(5): 17-25 (2003) |
| 2002 |
|---|
| 1 | EE | Nandu Tendolkar,
Rajesh Raina,
Rick Woltenberg,
Xijiang Lin,
Bruce Swanson,
Greg Aldrich:
Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture.
VTS 2002: 3-8 |
