2007 |
6 | EE | Vikram Iyengar,
Kenneth Pichamuthu,
Andrew Ferko,
Frank Woytowich,
David E. Lackey,
Gary Grise,
Mark Taylor,
Mike Degregorio,
Steven F. Oakland:
An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs.
VTS 2007: 173-178 |
2003 |
5 | EE | Darren Anand,
Bruce Cowan,
Owen Farnsworth,
Peter Jakobsen,
Steven F. Oakland,
Michael Ouellette,
Donald L. Wheater:
An On-Chip Self-Repair Calculation and Fusing Methodology.
IEEE Design & Test of Computers 20(5): 67-75 (2003) |
2002 |
4 | EE | Steven F. Oakland:
TAPs All Over My Chips.
ITC 2002: 1192 |
3 | EE | Bruce Cowan,
Owen Farnsworth,
Peter Jakobsen,
Steven F. Oakland,
Michael Ouellette,
Donald L. Wheater:
On-Chip Repair and an ATE Independent Fusing Methodology.
ITC 2002: 178-186 |
2000 |
2 | | Steven F. Oakland:
Considerations for implementing IEEE 1149.1 on system-on-a-chip integrated circuits.
ITC 2000: 628-637 |
1997 |
1 | | Steven F. Oakland:
Why Would an ASIC Foundry Accept Anything Less than Full Scan?
ITC 1997: 1031 |