Kenneth P. Parker

2004
23	EE	Kenneth P. Parker: Board Test Coverage Needs to be Standardized. ITC 2004: 1426
22	EE	Kenneth P. Parker: A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. ITC 2004: 365-374
2003
21	EE	Kenneth P. Parker: Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes?. ITC 2003: 1268-1276
20		Kenneth P. Parker: Testing for what? IEEE Design & Test of Computers 20(2): 96- (2003)
19	EE	Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Design & Test of Computers 20(5): 76-83 (2003)
2002
18	EE	Bill Eklow, Carl Barnhart, Kenneth P. Parker: IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC 2002: 1056-1065
17	EE	Kathy Hird, Kenneth P. Parker, Bill Follis: Test Coverage: What Does It Mean When a Board Test Passes?. ITC 2002: 1066-1074
16	EE	Kenneth P. Parker: Board Test Is NOT Mature. ITC 2002: 1238
2001
15		Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick: Frequency detection-based boundary-scan testing of AC coupled nets. ITC 2001: 46-53
2000
14		Kenneth P. Parker: System issues in boundary-scan board test. ITC 2000: 724-728
1997
13		Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa: Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498
1996
12		Mick Tegethoff, Kenneth P. Parker, Ken Lee: Opens Board Test Coverage: When is 99% Really 40%? ITC 1996: 333-339
11		Kenneth P. Parker: Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. ITC 1996: 924
1995
10		Kenneth P. Parker, David Greene: The ITC Lecture Series: An Experiment. ITC 1995: 925
9	EE	Mick Tegethoff, Kenneth P. Parker: IEEE Std 1149.1: Where Are We? Where From Here? IEEE Design & Test of Computers 12(2): 53-59 (1995)
1994
8		Kenneth P. Parker: Observations on the 1149.x Family of Standards. ITC 1994: 1023
1993
7		Kenneth P. Parker, John E. McDermid, Stig Oresjo: Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322
1991
6	EE	Kenneth P. Parker, Stig Oresjo: A language for describing boundary scan devices. J. Electronic Testing 2(1): 43-75 (1991)
1982
5		Thomas W. Williams, Kenneth P. Parker: Design for Testability - A Survey. IEEE Trans. Computers 31(1): 2-15 (1982)
1978
4		Edward J. McCluskey, Kenneth P. Parker, John J. Shedletsky: Boolean Network Probabilities and Network Design. IEEE Trans. Computers 27(2): 187-189 (1978)
3		Kenneth P. Parker, Edward J. McCluskey: Sequential Circuit Output Probabilities From Regular Expressions. IEEE Trans. Computers 27(3): 222-231 (1978)
1975
2		Kenneth P. Parker, Edward J. McCluskey: Analysis of Logic Circuits with Faults Using Input Signal Probabilities. IEEE Trans. Computers 24(5): 573-578 (1975)
1		Kenneth P. Parker, Edward J. McCluskey: Probabilistic Treatment of General Combinational Networks. IEEE Trans. Computers 24(6): 668-670 (1975)

Coauthor Index

1	Carl Barnhart	[18] [19]
2	Rodney A. Browen	[13]
3	Bill Eklow (William Eklow)	[18] [19]
4	Bill Follis	[17]
5	David Greene	[10]
6	Katsuhiro Hirayama	[13]
7	Kathy Hird	[17]
8	Young Kim	[15]
9	Benny Lai	[15]
10	Ken Lee	[12]
11	Akira Matsuzawa	[13]
12	Edward J. McCluskey	[1] [2] [3] [4]
13	John E. McDermid	[7] [13]
14	Kozo Nuriya	[13]
15	Stig Oresjo	[6] [7]
16	Jeff Rearick	[15]
17	John J. Shedletsky	[4]
18	Mick Tegethoff	[9] [12]
19	Thomas W. Williams	[5]

Colors in the list of coauthors