Giorgio Di Natale

2008
27	EE	Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: An Integrated Validation Environment for Differential Power Analysis. DELTA 2008: 527-532
26	EE	Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: March Test Generation Revealed. IEEE Trans. Computers 57(12): 1704-1713 (2008)
2007
25		Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: A Novel Parity Bit Scheme for SBox in AES Circuits. DDECS 2007: 267-271
24	EE	Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale: Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC. IOLTS 2007: 205-206
23	EE	Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. IOLTS 2007: 57-62
22		Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: A Dependable Parallel Architecture for SBoxes. ReCoSoC 2007: 132-137
2006
21	EE	Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic march tests generations for static linked faults in SRAMs. DATE 2006: 1258-1263
20		Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs. DDECS 2006: 157-158
19	EE	Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Automatic March Tests Generation for Multi-Port SRAMs. DELTA 2006: 385-392
18	EE	Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto: Single-Event Upset Analysis and Protection in High Speed Circuits. European Test Symposium 2006: 29-34
17	EE	Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A 22n March Test for Realistic Static Linked Faults in SRAMs. European Test Symposium 2006: 49-54
2003
16	EE	Fabrizio Bertuccelli, Franco Bigongiari, Andrea S. Brogna, Giorgio Di Natale, Paolo Prinetto, Roberto Saletti: Exhaustive Test of Several Dependable Memory Architectures Designed by GRAAL Tool. Asian Test Symposium 2003: 32-37
15	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: A Watchdog Processor to Detect Data and Control Flow Errors. IOLTS 2003: 144-148
14	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, I. Solcia, Luca Tagliaferri: FAUST: FAUlt-injection Script-based Tool. IOLTS 2003: 160
13	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri: Data Critically Estimation In Software Applications. ITC 2003: 802-810
12	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Online Self-Repair of FIR Filters. IEEE Design & Test of Computers 20(3): 50-57 (2003)
2002
11	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Specification and Design of a New Memory Fault Simulator. Asian Test Symposium 2002: 92-97
10	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: An Optimal Algorithm for the Automatic Generation of March Tests. DATE 2002: 938-943
9	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Static Analysis of SEU Effects on Software Applications. ITC 2002: 500-508
2001
8	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: Memory Read Faults: Taxonomy and Automatic Test Generation. Asian Test Symposium 2001: 157-163
7	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Luca Tagliaferri: Control-Flow Checking via Regular Expressions. Asian Test Symposium 2001: 299-303
6	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto: SEU effect analysis in an open-source router via a distributed fault injection environment. DATE 2001: 219-225
5	EE	Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Luca Tagliaferri, Paolo Prinetto: Validation of a Software Dependability Tool via Fault Injection Experiments. IOLTW 2001: 3-8
4		Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Franco Bigongiari: GRAAL: a tool for highly dependable SRAMs generation. ITC 2001: 250-257
3	EE	Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni: Online and Offline BIST in IP-Core Design. IEEE Design & Test of Computers 18(5): 92-99 (2001)
2000
2	EE	Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni: A Family of Self-Repair SRAM Cores. IOLTW 2000: 214-218
1		Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, Monica Lobetti Bodoni: A programmable BIST architecture for clusters of multiple-port SRAMs. ITC 2000: 557-566

Coauthor Index

1	Alfredo Benso	[1] [2] [3] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [17] [18] [19] [20] [21] [24] [26]
2	Fabrizio Bertuccelli	[16]
3	Franco Bigongiari	[4] [16]
4	Monica Lobetti Bodoni	[1] [2] [3]
5	Alberto Bosio	[17] [19] [20] [21] [26]
6	Andrea S. Brogna	[16]
7	Stefano Di Carlo	[1] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [17] [18] [19] [20] [21] [24] [26]
8	Silvia Chiusano	[2] [3] [4]
9	Marie-Lise Flottes	[22] [23] [25] [27]
10	Mohammad Hosseinabady	[18] [24]
11	Pejman Lotfi-Kamran	[18]
12	Zainalabedin Navabi	[24]
13	Mohammad Hossein Neishaburi	[24]
14	Paolo Prinetto	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [24] [26]
15	Bruno Rouzeyre	[22] [23] [25] [27]
16	Roberto Saletti	[16]
17	I. Solcia	[14]
18	Luca Tagliaferri	[5] [7] [13] [14]