W. Robert Daasch

2008
24	EE	Saurabh Jain, W. Robert Daasch, David Armbrust: Analyzing the Impact of Fault Tolerant BIST for VLSI Design. DFT 2008: 152-160
2006
23	EE	Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware: Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006)
2005
22	EE	Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch: Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432
2004
21		Haiqiao Xiao, Rolf Schaumann, W. Robert Daasch, Phillip K. Wong, Branimir Pejcinovic: A radio-frequency CMOS active inductor and its application in designing high-Q filters. ISCAS (4) 2004: 197-200
20	EE	W. Robert Daasch, Manu Rehani: Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428
19	EE	Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler: In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212
18	EE	Chris Schuermyer, Jens Ruffler, W. Robert Daasch: Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308
17	EE	Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware: Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192
2003
16	EE	Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning: Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573
15	EE	Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch: Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46
14	EE	Robert Madge, Brady Benware, W. Robert Daasch: Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Design & Test of Computers 20(5): 46-53 (2003)
2002
13	EE	Chee How Lim, W. Robert Daasch, George Cai: A Thermal-Aware Superscalar Microprocessor (invited). ISQED 2002: 517-522
12	EE	W. Robert Daasch, Kevin Cota, James McNames, Robert Madge: Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data. ITC 2002: 1240
11	EE	David Turner, David Abercrombie, James McNames, W. Robert Daasch, Robert Madge: Isolating and Removing Sources of Variation in Test Data. ITC 2002: 464-471
10	EE	Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner: Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682
9	EE	Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch: Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74
8	EE	Ali Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins: Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. IEEE Design & Test of Computers 19(5): 36-43 (2002)
7	EE	W. Robert Daasch, James McNames, Robert Madge, Kevin Cota: Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort. IEEE Design & Test of Computers 19(5): 74-81 (2002)
2001
6		W. Robert Daasch, Kevin Cota, James McNames, Robert Madge: Neighbor selection for variance reduction in I_DDQ and other parametric data. ITC 2001: 92-100
2000
5		W. Robert Daasch, James McNames, Daniel Bockelman, Kevin Cota: Variance reduction using wafer patterns in I_ddQ data. ITC 2000: 189-198
4	EE	Ashutosh S. Dhodapkar, Chee How Lim, George Cai, W. Robert Daasch: TEM2P2EST: A Thermal Enabled Multi-model Power/Performance ESTimator. PACS 2000: 112-125
1995
3		Michael A. Driscoll, W. Robert Daasch: Accurate Predictions of Parallel Program Execution Time. J. Parallel Distrib. Comput. 25(1): 16-30 (1995)
1993
2		Pan Wu, Rolf Schaumann, W. Robert Daasch: A 20 MHz Fully-balanced Transconductance-C Filter in 2 µm CMOS Technology. ISCAS 1993: 1188-1191
1987
1		William A. Payne III, Fillia Makedon, W. Robert Daasch: High Speed Interconnection Using the Clos Network. ICS 1987: 96-111

Coauthor Index

1	David Abercrombie	[11]
2	David Armbrust	[24]
3	Brady Benware	[14] [15] [16] [17] [19] [22] [23]
4	Daniel Bockelman	[5]
5	George Cai	[4] [13]
6	Kevin Cota	[5] [6] [7] [9] [12] [16]
7	Vivek De	[8]
8	Ashutosh S. Dhodapkar	[4]
9	Michael A. Driscoll	[3]
10	B. H. Goh	[10]
11	Charles F. Hawkins	[8]
12	Saurabh Jain	[24]
13	Ali Keshavarzi	[8]
14	Chee How Lim	[4] [13]
15	Ethan Long	[17]
16	Cam Lu	[15]
17	Joel Lurkins	[23]
18	C. Macchietto	[10]
19	Robert Madge	[6] [7] [9] [10] [11] [12] [14] [15] [16] [17] [19] [22]
20	Fillia Makedon	[1]
21	James McNames	[5] [6] [7] [11] [12]
22	Siva Narendra	[8]
23	L. Ning	[16]
24	William A. Payne III	[1]
25	Branimir Pejcinovic	[21]
26	V. Rajagopalan	[10]
27	Manu Rehani	[9] [20]
28	Kaushik Roy	[8]
29	Jens Ruffler	[18] [19]
30	Manoj Sachdev	[8]
31	Rolf Schaumann	[2] [21]
32	Chris Schuermyer	[10] [16] [18] [19]
33	Thaddeus T. Shannon	[22]
34	C. Taylor	[10]
35	James Tschanz	[8]
36	Ritesh P. Turakhia	[19] [22] [23]
37	David Turner	[10] [11]
38	Phillip K. Wong	[21]
39	Pan Wu	[2]
40	Haiqiao Xiao	[21]

Colors in the list of coauthors