2003 |
4 | EE | Alfred L. Crouch,
John C. Potter,
Jason Doege:
AC Scan Path Selection for Physical Debugging.
IEEE Design & Test of Computers 20(5): 34-40 (2003) |
2000 |
3 | | Teresa L. McLaurin,
John C. Potter:
On-the-shelf core pattern methodology for ColdFire(R) microprocessor cores.
ITC 2000: 1100-1107 |
2 | EE | Alfred L. Crouch,
Michael Mateja,
Teresa L. McLaurin,
John C. Potter,
Dat Tran:
Test Development for a Third-Version ColdFire Microprocessor.
IEEE Design & Test of Computers 17(4): 29-37 (2000) |
1999 |
1 | | Alfred L. Crouch,
Michael Mateja,
Teresa L. McLaurin,
John C. Potter,
Dat Tran:
The testability features of the 3rd generation ColdFire family of microprocessors.
ITC 1999: 913-922 |