| 2007 |
|---|
| 20 | EE | Srikanth Venkataraman,
Ruchir Puri,
Steve Griffith,
Ankush Oberai,
Robert Madge,
Greg Yeric,
Walter Ng,
Yervant Zorian:
Making Manufacturing Work For You.
DAC 2007: 107-108 |
| 2005 |
|---|
| 19 | EE | Ritesh P. Turakhia,
Brady Benware,
Robert Madge,
Thaddeus T. Shannon,
W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ.
VTS 2005: 427-432 |
| 18 | EE | Robert Madge:
New test paradigms for yield and manufacturability.
IEEE Design & Test of Computers 22(3): 240-246 (2005) |
| 2004 |
|---|
| 17 | EE | Brady Benware,
Cam Lu,
John Van Slyke,
Prabhu Krishnamurthy,
Robert Madge,
Martin Keim,
Mark Kassab,
Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
ITC 2004: 1285-1294 |
| 16 | EE | Robert Madge:
New Test Paradigms for Yield and Manufacturability.
ITC 2004: 13 |
| 15 | EE | Robert Madge:
ATE Value Add through Open Data Collection.
ITC 2004: 1430 |
| 14 | EE | Manu Rehani,
David Abercrombie,
Robert Madge,
Jim Teisher,
Jason Saw:
ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test.
ITC 2004: 181-189 |
| 13 | EE | Robert Madge,
Brady Benware,
Ritesh P. Turakhia,
W. Robert Daasch,
Chris Schuermyer,
Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.
ITC 2004: 203-212 |
| 12 | EE | Ethan Long,
W. Robert Daasch,
Robert Madge,
Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC.
VTS 2004: 185-192 |
| 2003 |
|---|
| 11 | EE | Erik Jan Marinissen,
Bart Vermeulen,
Robert Madge,
Michael Kessler,
Michael Müller:
Creating Value Through Test.
DATE 2003: 10402-10409 |
| 10 | EE | Brady Benware,
Chris Schuermyer,
Sreenevasan Ranganathan,
Robert Madge,
Prabhu Krishnamurthy,
Nagesh Tamarapalli,
Kun-Han Tsai,
Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality.
ITC 2003: 1031-1040 |
| 9 | EE | Chris Schuermyer,
Brady Benware,
Kevin Cota,
Robert Madge,
W. Robert Daasch,
L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.
ITC 2003: 565-573 |
| 8 | EE | Brady Benware,
Robert Madge,
Cam Lu,
W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.
VTS 2003: 39-46 |
| 7 | EE | Robert Madge,
Brady Benware,
W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.
IEEE Design & Test of Computers 20(5): 46-53 (2003) |
| 2002 |
|---|
| 6 | EE | W. Robert Daasch,
Kevin Cota,
James McNames,
Robert Madge:
Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data.
ITC 2002: 1240 |
| 5 | EE | David Turner,
David Abercrombie,
James McNames,
W. Robert Daasch,
Robert Madge:
Isolating and Removing Sources of Variation in Test Data.
ITC 2002: 464-471 |
| 4 | EE | Robert Madge,
B. H. Goh,
V. Rajagopalan,
C. Macchietto,
W. Robert Daasch,
Chris Schuermyer,
C. Taylor,
David Turner:
Screening MinVDD Outliers Using Feed-Forward Voltage Testing.
ITC 2002: 673-682 |
| 3 | EE | Robert Madge,
Manu Rehani,
Kevin Cota,
W. Robert Daasch:
Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies.
VTS 2002: 69-74 |
| 2 | EE | W. Robert Daasch,
James McNames,
Robert Madge,
Kevin Cota:
Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort.
IEEE Design & Test of Computers 19(5): 74-81 (2002) |
| 2001 |
|---|
| 1 | | W. Robert Daasch,
Kevin Cota,
James McNames,
Robert Madge:
Neighbor selection for variance reduction in I_DDQ and other parametric data.
ITC 2001: 92-100 |
