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Hans G. Kerkhoff

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2008
39EEHans G. Kerkhoff, Jarkko J. M. Huijts: Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications. DELTA 2008: 38-44
38EEOscar Kuiken, Xiao Zhang, Hans G. Kerkhoff: Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications. DFT 2008: 45-53
2007
37EEHans G. Kerkhoff: Testing Microelectronic Biofluidic Systems. IEEE Design & Test of Computers 24(1): 72-82 (2007)
2006
36EEHans G. Kerkhoff, X. Zhang, R. W. Barber, D. R. Emerson: Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. DELTA 2006: 177-182
2005
35EEHans G. Kerkhoff: The test search for true mixed-signal cores. Microelectronics Journal 36(12): 1103-1111 (2005)
2004
34EEHans G. Kerkhoff, Arun A. Joseph: Testability Issues in Superconductor Electronic. DELTA 2004: 9-14
33EEOctavian Petre, Hans G. Kerkhoff: Scan Test Strategy for Asynchronous-Synchronous Interfaces. J. Electronic Testing 20(6): 639-645 (2004)
2003
32EEArun A. Joseph, Hans G. Kerkhoff: Towards Structural Testing of Superconductor Electronics. ITC 2003: 1182-1191
31EEHans G. Kerkhoff, Mustafa Acar: Testable Design and Testing of Micro-Electro-Fluidic Arrays. VTS 2003: 403-409
30EENur Engin, Hans G. Kerkhoff: Fast Fault Simulation for Nonlinear Analog Circuits. IEEE Design & Test of Computers 20(2): 40-47 (2003)
29EEFrank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff: Synchronous Full-Scan for Asynchronous Handshake Circuits. J. Electronic Testing 19(4): 397-406 (2003)
28EEHans G. Kerkhoff, Bozena Kaminska: Analog and mixed signal test techniques for SoCs. Microelectronics Journal 34(10): 887-888 (2003)
27EEM. Stancic, Hans G. Kerkhoff: Testability-analysis driven test-generation of analogue cores. Microelectronics Journal 34(10): 913-917 (2003)
2002
26EEOctavian Petre, Hans G. Kerkhoff: On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications. Asian Test Symposium 2002: 122-
25EEHans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans: Testable Design and Testing of High-Speed Superconductor Microelectronics. DELTA 2002: 8-12
24EEFrank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff: Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813
23EEM. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff: A New Test Generation Approach for Embedded Analogue Cores in SoC. ITC 2002: 861-869
22EESalvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim: SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450
21EEV. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures. J. Electronic Testing 18(2): 203-212 (2002)
2001
20EEOctavian Petre, Hans G. Kerkhoff: Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. IOLTW 2001: 95-99
19 Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff: Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC 2001: 1098-1107
18EEDavid San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Modeling a Verification Test System for Mixed-Signal Circuits. IEEE Design & Test of Computers 18(1): 63-71 (2001)
17EEHans G. Kerkhoff, Han Speek, M. Shashani, Manoj Sachdev: Design for Delay Testability in High-Speed Digital ICs. J. Electronic Testing 17(3-4): 225-231 (2001)
16EEHans G. Kerkhoff, Hans P. A. Hendriks: Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems. J. Electronic Testing 17(5): 427-437 (2001)
2000
15EEV. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Design and Test Space Exploration of Transport-Triggered Architectures. DATE 2000: 146-
14EEHans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev: A Low-Speed BIST Framework for High-Performance Circuit Testing. VTS 2000: 349-358
1999
13EEManoj Sachdev, Hans G. Kerkhoff: Configurations for IDDQ-Testable PLAs. IEEE Design & Test of Computers 16(2): 58-65 (1999)
12EEChris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff: Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electronic Testing 14(1-2): 125-131 (1999)
11EERichard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev: Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. J. Electronic Testing 14(1-2): 67-74 (1999)
10EENur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek: Integrated Design and Test of Mixed-Signal Circuits. J. Electronic Testing 14(1-2): 75-83 (1999)
1998
9EEHans G. Kerkhoff: Microsystem Testing: Challenge or Common Knowledge?. Asian Test Symposium 1998: 510-511
1997
8EERonald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff: Smart sensor system application: an integrated compass. ED&TC 1997: 195-199
7EEV. Kaal, Hans G. Kerkhoff: Compact structural test generation for analog macros. ED&TC 1997: 581-587
1990
6 Jon T. Butler, Hans G. Kerkhoff, Siep Onneweer: A Comparative Analysis of Multiplexer Techniques for the Minimization of Function Cost Using the Costtable Approach. ISMVL 1990: 286-291
5EER. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg: Designing and Implementing an Architecture with Boundary Scan. IEEE Design & Test of Computers 7(1): 9-19 (1990)
4EEGertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff: Testability analysis of analog systems. IEEE Trans. on CAD of Integrated Circuits and Systems 9(6): 573-583 (1990)
1988
3 Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff: TASTE: A Tool for Analog System Testability Evaluation. ITC 1988: 829-838
2 Jon T. Butler, Hans G. Kerkhoff: Multiple-Valued CCD Circuits. IEEE Computer 21(4): 58-69 (1988)
1981
1 Hans G. Kerkhoff, Marius L. Tervoert: Multiple-Valued Logic Charge-Coupled Devices. IEEE Trans. Computers 30(9): 644-652 (1981)

Coauthor Index

1Mustafa Acar [31]
2R. W. Barber [36]
3H. Bederr [22]
4Frank te Beest [24] [29]
5David San Segundo Bello [18]
6Kees van Berkel [24] [29]
7R. D. (Shawn) Blanton (Ronald D. Blanton) [22]
8Jon T. Butler [2] [6]
9G. Diemel [8]
10D. R. Emerson [36]
11Nur Engin [10] [30]
12L. Fang [23]
13Chris Feige [12]
14Gertjan J. Hemink [3] [4]
15Hans P. A. Hendriks [16]
16Sander Heuvelmans [25]
17Jarkko J. M. Huijts [39]
18Arun A. Joseph [25] [32] [34]
19V. Kaal [7]
20Linda A. Kamas [19]
21Bozena Kaminska [28]
22Ajay Khoche [19]
23H. J. Klim [22]
24A. Kloppenburg [5]
25Oscar Kuiken [38]
26Berend W. Meijer [3] [4]
27Salvador Mir [22]
28Siep Onneweer [6]
29Ad M. G. Peeters [24] [29]
30Octavian Petre [20] [26] [33]
31Jan Ten Pierick [12]
32R. P. van Riessen [5]
33Jochen Rivoir [19]
34Richard Rosing [11]
35Manoj Sachdev [11] [13] [14] [17]
36Mansour Shashaani [14]
37M. Shashani [17]
38Han Speek [10] [17]
39M. Stancic [23] [27]
40Ronald J. W. T. Tangelder [8] [10] [11] [12] [15] [18] [21]
41Marius L. Tervoert [1]
42R. M. W. Tijink [23]
43Marc Verra [24]
44Erik H. Volkerink [19]
45M. H. H. Weusthof [23]
46Clemens Wouters [12]
47X. Zhang [36]
48Xiao Zhang [38]
49V. A. Zivkovic [15] [21]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)