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Pascal Nouet

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2008
23EENorbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet: A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. DDECS 2008: 304-309
22EEOlivier Leman, Laurent Latorre, Frédérick Mailly, Pascal Nouet: A Closed-Loop Architecture with Digital Output for Convective Accelerometers. ISVLSI 2008: 51-56
21EEBoris Alandry, Norbert Dumas, Laurent Latorre, Frédérick Mailly, Pascal Nouet: A CMOS Multi-sensor System for 3D Orientation Determination. ISVLSI 2008: 57-62
20EEPascal Nouet, Frédérick Mailly, Laurent Latorre, Pascal Nouet: Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers CoRR abs/0805.0920: (2008)
19EEPascal Nouet, Frédérick Mailly, Laurent Latorre, Pascal Nouet: Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers CoRR abs/0805.0920: (2008)
18EEEl Mehdi Boujamaa, Yannick Soulie, Frédérick Mailly, Laurent Latorre, Pascal Nouet: Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS CoRR abs/0805.0925: (2008)
2007
17EEErik Schüler, Marcelo Negreiros, Pascal Nouet, Luigi Carro: A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. European Test Symposium 2007: 21-28
16EEHumberto Campanella, Arantxa Uranga, Pascal Nouet, Pedro De Paco, Nuria Barniol, Jaume Esteve: Instantaneous de-embedding of the on-wafer equivalent-circuit parameters of acoustic resonator (FBAR) for integrated circuit applications. SBCCI 2007: 212-217
2006
15EENorbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet: Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electronic Testing 22(2): 189-198 (2006)
14EEChristophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet: Electro-thermal short pulsed simulation for SOI technology. Microelectronics Reliability 46(9-11): 1482-1485 (2006)
2005
13EENorbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet: On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS 2005: 213-218
12EEFlorence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell: A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electronic Testing 21(1): 9-16 (2005)
11EEFlorence Azaïs, B. Caillard, S. Dournelle, P. Salomé, Pascal Nouet: A new multi-finger SCR-based structure for efficient on-chip ESD protection. Microelectronics Reliability 45(2): 233-243 (2005)
2004
10EELaurent Latorre, Vincent Beroulle, Pascal Nouet: Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 962-967 (2004)
2003
9EEUros Kac, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell: Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test. IEEE Design & Test of Computers 20(2): 32-39 (2003)
2002
8EEVincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120
7EEVincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS 2002: 439-444
2001
6 David Bernard, Christian Landrault, Pascal Nouet: Interconnect Capacitance Modelling in a VDSM CMOS Technology. VLSI-SOC 2001: 133-144
5 Vincent Beroulle, Laurent Latorre, M. Dardalhon, C. Oudea, G. Perez, F. Pressecq, Pascal Nouet: Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC 2001: 241-251
4 Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC 2001: 461-472
3EEVincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet: Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electronic Testing 17(5): 439-450 (2001)
1999
2EELaurent Latorre, Yves Bertrand, P. Hazard, F. Pressecq, Pascal Nouet: Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. DATE 1999: 239-243
1EEA. Toulouse, David Bernard, Christian Landrault, Pascal Nouet: Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts. DATE 1999: 576-580

Coauthor Index

1Boris Alandry [21]
2Florence Azaïs [9] [11] [12] [13] [14] [15] [23]
3Nuria Barniol [16]
4David Bernard [1] [6]
5Vincent Beroulle [3] [4] [5] [7] [8] [10]
6Yves Bertrand [2] [3] [4] [7] [8]
7El Mehdi Boujamaa [18]
8B. Caillard [11]
9Humberto Campanella [16]
10Luigi Carro [17]
11M. Dardalhon [5]
12S. Dournelle [11]
13Norbert Dumas [13] [15] [21] [23]
14Christophe Entringer [14]
15Jaume Esteve [16]
16Philippe Flatresse [14]
17Philippe Galy [14]
18P. Hazard [2]
19Uros Kac [9]
20Christian Landrault [1] [6]
21Laurent Latorre [2] [3] [4] [5] [7] [8] [10] [13] [15] [18] [20] [21] [22]
22Olivier Leman [22]
23Marcelo Lubaszewski [12]
24Frédérick Mailly [18] [20] [21] [22] [23]
25Marcelo Negreiros [17]
26Franc Novak [9]
27C. Oudea [5]
28Pedro De Paco [16]
29G. Perez [5]
30F. Pressecq [2] [5]
31Michel Renovell [9] [12]
32Andrew Richardson [23]
33P. Salomé [11]
34Erik Schüler [17]
35Yannick Soulie [18]
36A. Toulouse [1]
37Arantxa Uranga [16]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)