Kee Sup Kim

2008
19	EE	Kee Sup Kim, Ming Zhang: Hierarchical Test Compression for SoC Designs. IEEE Design & Test of Computers 25(2): 142-148 (2008)
2007
18	EE	Ming Zhang, T. M. Mak, James Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu: Design for Resilience to Soft Errors and Variations. IOLTS 2007: 23-28
2006
17	EE	Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim: Soft Error Resilient System Design through Error Correction. VLSI-SoC 2006: 332-337
16	EE	Kee Sup Kim, Mohammad Tehranipoor: Session Abstract. VTS 2006: 292-293
15	EE	Subhasish Mitra, Kee Sup Kim: XPAND: An Efficient Test Stimulus Compression Technique. IEEE Trans. Computers 55(2): 163-173 (2006)
14	EE	Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, N. J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, S. J. Patel: Sequential Element Design With Built-In Soft Error Resilience. IEEE Trans. VLSI Syst. 14(12): 1368-1378 (2006)
2005
13	EE	Nic Mokhoff, Yervant Zorian, Kamalesh N. Ruparel, Hao Nham, Francesco Pessolano, Kee Sup Kim: How to determine the necessity for emerging solutions. DAC 2005: 274-275
12	EE	Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim: Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. IEEE Computer 38(2): 43-52 (2005)
2004
11	EE	Subhasish Mitra, Kee Sup Kim: X-compact: an efficient response compaction technique. IEEE Trans. on CAD of Integrated Circuits and Systems 23(3): 421-432 (2004)
2003
10	EE	Subhasish Mitra, Kee Sup Kim: XMAX: X-Tolerant Architecture for MAXimal Test Compression. ICCD 2003: 326-330
9	EE	David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish: H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC 2003: 1229-1238
8	EE	Kee Sup Kim, Subhasish Mitra, Paul G. Ryan: Delay Defect Characteristics and Testing Strategies. IEEE Design & Test of Computers 20(5): 8-16 (2003)
2002
7	EE	Subhasish Mitra, Kee Sup Kim: X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. ITC 2002: 311-320
2001
6	EE	Kee Sup Kim, Rathish Jayabharathi, Craig Carstens: SpeedGrade: An RTL Path Delay Fault Simulator. Asian Test Symposium 2001: 239-243
5		Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine: DPDAT: data path direct access testing. ITC 2001: 188-195
1995
4	EE	Kee Sup Kim, Charles R. Kime: Partial scan flip-flop selection by use of empirical testability. J. Electronic Testing 7(1-2): 47-59 (1995)
1994
3		Kee Sup Kim, Len Schultz: Multi-Frequency, Multi-Phase Scan Chain. ITC 1994: 323-330
1993
2		Kee Sup Kim, Charles R. Kime: Partial Scan Using Reverse Direction Empirical Testability. ITC 1993: 498-506
1990
1		Kee Sup Kim, Charles R. Kime: Partial Scan by Use of Empirical Testability. ICCAD 1990: 314-317

Coauthor Index

1	Adrian Carbine	[5]
2	Craig Carstens	[5] [6]
3	Derek Feltham	[5]
4	Talal Jaber	[9]
5	Rathish Jayabharathi	[5] [6]
6	Pete Johnson	[9]
7	Charles R. Kime	[1] [2] [4]
8	Mike Lin	[9]
9	Davia Lu	[18]
10	T. M. Mak	[14] [17] [18]
11	Dale March	[9]
12	Subhasish Mitra	[7] [8] [9] [10] [11] [12] [14] [15] [17]
13	Nic Mokhoff	[13]
14	Hao Nham	[13]
15	Greg Parrish	[9]
16	S. J. Patel	[14]
17	Francesco Pessolano	[13]
18	Kamalesh N. Ruparel	[13]
19	Paul G. Ryan	[8]
20	Anil Sabbavarapu	[9]
21	Len Schultz	[3]
22	Norbert Seifert	[12] [14] [17] [18]
23	Naresh R. Shanbhag	[14]
24	Quan Shi	[12] [14]
25	Mohammad Tehranipoor	[16]
26	James Tschanz	[18]
27	Praveen Vishakantaiah	[5]
28	N. J. Wang	[14]
29	David M. Wu	[9]
30	Ming Zhang	[12] [14] [17] [18] [19]
31	Yervant Zorian	[13]

Colors in the list of coauthors