Sassan Tabatabaei

2005
14	EE	Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei: A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. J. Electronic Testing 21(6): 621-630 (2005)
2004
13	EE	Andy Kuo, Touraj Farahmand, Nelson Ou, André Ivanov, Sassan Tabatabaei: Jitter Models and Measurement Methods for High-Speed Serial Interconnects. ITC 2004: 1295-1302
12	EE	Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev: Jitter Generation and Measurement for Test of Multigbps Serial IO. ITC 2004: 1313-1321
11	EE	Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov: Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. IEEE Design & Test of Computers 21(4): 302-313 (2004)
2003
10	EE	Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov: Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. Asian Test Symposium 2003: 348-353
9	EE	Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei: An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test of Computers 20(1): 60-67 (2003)
2002
8	EE	Sassan Tabatabaei, André Ivanov: An Embedded Core for Sub-Picosecond Timing Measurements. ITC 2002: 129-137
7	EE	Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song: Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? VTS 2002: 175-176
6	EE	Karim Arabi, Klaus-Dieter Hilliges, David C. Keezer, Sassan Tabatabaei: Multi-GigaHertz Testing Challenges and Solutions. VTS 2002: 265-268
5	EE	Sassan Tabatabaei, André Ivanov: Embedded Timing Analysis: A SoC Infrastructure. IEEE Design & Test of Computers 19(3): 24-36 (2002)
1999
4	EE	Sassan Tabatabaei, André Ivanov: A built-in current monitor for testing analog circuit blocks. ISCAS (2) 1999: 109-114
3	EE	Sassan Tabatabaei, André Ivanov: A Current Integrator for BIST of Mixed-Signal ICs. VTS 1999: 311-318
1998
2	EE	Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell: Testing for Floating Gates Defects in CMOS Circuits. Asian Test Symposium 1998: 228-236
1997
1	EE	Maneesha Dalmia, André Ivanov, Sassan Tabatabaei: Power supply current monitoring techniques for testing PLLs. Asian Test Symposium 1997: 366-371

Coauthor Index

1	Karim Arabi	[6]
2	Florence Azaïs	[9]
3	Barry Baril	[7]
4	Freddy Ben-Zeev	[12]
5	Yves Bertrand	[9]
6	Yong B. Cho	[10] [14]
7	Maneesha Dalmia	[1]
8	Touraj Farahmand	[11] [13] [14]
9	Klaus-Dieter Hilliges	[6]
10	André Ivanov	[1] [2] [3] [4] [5] [8] [9] [10] [11] [13] [14]
11	David C. Keezer	[6]
12	Andy Kuo	[11] [13] [14]
13	Michael Lee	[12]
14	Fidel Muradali	[7]
15	Adam Osseiran	[7]
16	Nelson Ou	[11] [13]
17	Ken Posse	[7]
18	Sumbal Rafiq	[2]
19	Michel Renovell	[2] [9]
20	Lee Song	[7]
21	Baosheng Wang	[10] [14]
22	William De Wilkins	[7]

Colors in the list of coauthors