Xijiang Lin

2008
22	EE	Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak: Reducing Scan Shift Power at RTL. VTS 2008: 139-146
21	EE	Xijiang Lin, Yu Huang: Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells. J. Electronic Testing 24(4): 327-334 (2008)
2007
20	EE	Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski: Low Shift and Capture Power Scan Tests. VLSI Design 2007: 793-798
19	EE	Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality CoRR abs/0710.4763: (2007)
18	EE	Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski: Scan-Based Tests with Low Switching Activity. IEEE Design & Test of Computers 24(3): 268-275 (2007)
2006
17	EE	Xijiang Lin, Janusz Rajski: The Impacts of Untestable Defects on Transition Fault Testing. VTS 2006: 2-7
16	EE	Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski: Scan Tests with Multiple Fault Activation Cycles for Delay Faults. VTS 2006: 343-348
2005
15	EE	Xijiang Lin, Janusz Rajski: Propagation delay fault: a new fault model to test delay faults. ASP-DAC 2005: 178-183
14	EE	Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE 2005: 56-61
13	EE	Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press: Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS 2005: 223-228
2003
12	EE	Xijiang Lin, Rob Thompson: Test generation for designs with multiple clocks. DAC 2003: 662-667
11	EE	Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli: High-Frequency, At-Speed Scan Testing. IEEE Design & Test of Computers 20(5): 17-25 (2003)
2002
10	EE	Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xijiang Lin, Janusz Rajski: Conflict driven techniques for improving deterministic test pattern generation. ICCAD 2002: 87-93
9	EE	Nandu Tendolkar, Rajesh Raina, Rick Woltenberg, Xijiang Lin, Bruce Swanson, Greg Aldrich: Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture. VTS 2002: 3-8
2001
8	EE	Irith Pomeranz, Sudhakar M. Reddy, Xijiang Lin: Experimental Results of Forward-Looking Reverse Order Fault Simulation on Industrial Circuits with Scan. Asian Test Symposium 2001: 467
7		Xijiang Lin, Janusz Rajski, Irith Pomeranz, Sudhakar M. Reddy: On static test compaction and test pattern ordering for scan designs. ITC 2001: 1088-1097
2000
6	EE	Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy: SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. VTS 2000: 205-212
1999
5	EE	Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy: Full Scan Fault Coverage With Partial Scan. DATE 1999: 468-472
4	EE	Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy: Techniques for improving the efficiency of sequential circuit test generation. ICCAD 1999: 147-151
3	EE	Sudhakar M. Reddy, Irith Pomeranz, Nadir Z. Basturkmen, Xijiang Lin: Procedures for Identifying Undetectable and Redundant Faults In Synchronous Sequential Circuits. VTS 1999: 275-283
1998
2	EE	Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy: MIX: A Test Generation System for Synchronous Sequential Circuits. VLSI Design 1998: 456-463
1	EE	Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy: On Removing Redundant Faults in Synchronous Sequential Circuits. VTS 1998: 168-175

Coauthor Index

1	Greg Aldrich	[9]
2	Elif Alpaslan	[22]
3	Olivier Barondeau	[13] [14] [19]
4	Nadir Z. Basturkmen	[3]
5	Matthias Beck	[13] [14] [19]
6	Wu-Tung Cheng	[6] [22]
7	Jennifer Dworak	[22]
8	Yu Huang	[21] [22]
9	Martin Kaibel	[14] [19]
10	Frank Poehl	[13] [14] [19]
11	Irith Pomeranz	[1] [2] [3] [4] [5] [6] [7] [8] [10] [16] [18] [20]
12	Ron Press	[11] [13] [14] [19]
13	Rajesh Raina	[9]
14	Janusz Rajski	[7] [10] [11] [15] [16] [17] [18] [20]
15	Sudhakar M. Reddy	[1] [2] [3] [4] [5] [6] [7] [8] [10] [16] [18] [20]
16	Santiago Remersaro	[18] [20]
17	Paul Reuter	[11]
18	Thomas Rinderknecht	[11]
19	Bruce Swanson	[9] [11]
20	Nagesh Tamarapalli	[11]
21	Nandu Tendolkar	[9]
22	Rob Thompson	[12]
23	Chen Wang	[10]
24	Rick Woltenberg	[9]
25	Zhuo Zhang	[16]