| 2008 |
|---|
| 55 | EE | Dong An,
Gordon W. Roberts:
A metastability-independent time-to-voltage converter.
ISCAS 2008: 2298-2301 |
| 54 | EE | Gordon W. Roberts:
Test Methods For Sigma-Delta Data Converters and Related Devices.
SBCCI 2008: 3 |
| 53 | EE | Gordon W. Roberts,
Mohammad Ali-Bakhshian:
Time-domain analog signal processing techniques.
SBCCI 2008: 7 |
| 2007 |
|---|
| 52 | EE | Christopher S. Taillefer,
Gordon W. Roberts:
Delta-Sigma Analog-to-Digital Conversion via Time-Mode Signal Processing.
ISCAS 2007: 13-16 |
| 2006 |
|---|
| 51 | EE | Mona Safi-Harb,
Gordon W. Roberts:
A CMOS circuit for embedded GHz measurement of digital signal rise time degradation.
ISCAS 2006 |
| 50 | EE | Christopher S. Taillefer,
Gordon W. Roberts:
Process-insensitive modulated-clock voltage comparator.
ISCAS 2006 |
| 49 | EE | Christian Jesús B. Fayomi,
Mohamad Sawan,
Gordon W. Roberts:
Low-Voltage Analog Switch in Deep Submicron CMOS: Design Technique and Experimental Measurements.
IEICE Transactions 89-A(4): 1076-1087 (2006) |
| 2005 |
|---|
| 48 | EE | Christian Jesús B. Fayomi,
Gordon W. Roberts,
Mohamad Sawan:
Low-voltage CMOS analog bootstrapped switch for sample-and-hold circuit: design and chip characterization.
ISCAS (3) 2005: 2200-2203 |
| 47 | EE | Christopher S. Taillefer,
Gordon W. Roberts:
Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment Without Increasing Test Time.
IEEE Trans. VLSI Syst. 13(7): 852-860 (2005) |
| 2004 |
|---|
| 46 | | Peter M. Levine,
Gordon W. Roberts:
A calibration technique for a high-resolution flash time-to-digital converter.
ISCAS (1) 2004: 253-256 |
| 45 | EE | Mourad Oulmane,
Gordon W. Roberts:
A CMOS time amplifier for Femto-second resolution timing measurement.
ISCAS (1) 2004: 509-512 |
| 44 | EE | Peter M. Levine,
Gordon W. Roberts:
A High-Resolution Flash Time-to-Digital Converter and Calibration Scheme.
ITC 2004: 1148-1157 |
| 43 | EE | Mohamed Hafed,
Antonio H. Chan,
Geoffrey Duerden,
Bardia Pishdad,
Clarence Tam,
Sebastien Laberge,
Gordon W. Roberts:
A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing.
ITC 2004: 728-737 |
| 42 | EE | Christopher S. Taillefer,
Gordon W. Roberts:
Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time.
ITC 2004: 953-962 |
| 41 | | Antonio H. Chan,
Gordon W. Roberts:
A jitter characterization system using a component-invariant Vernier delay line.
IEEE Trans. VLSI Syst. 12(1): 79-95 (2004) |
| 2003 |
|---|
| 40 | EE | C. K. L. Tam,
Gordon W. Roberts:
A DC current measurement circuit for on-chip applications.
ISCAS (1) 2003: 101-104 |
| 39 | | Robert C. Aitken,
Gordon W. Roberts:
ITC 2003: Breaking Test Interface Bottlenecks.
IEEE Design & Test of Computers 20(5): 54- (2003) |
| 38 | | Gordon W. Roberts,
Robert C. Aitken:
ITC Highlights.
IEEE Design & Test of Computers 20(5): 55-57 (2003) |
| 2002 |
|---|
| 37 | EE | Bardia Pishdad,
Gordon W. Roberts:
A 10-bit 1 MS/s 3-step ADC with bitstream-based sub-DAC and sub-ADC calibration.
ISCAS (1) 2002: 501-504 |
| 36 | EE | Sebastien Laberge,
Gordon W. Roberts:
Temperature compensated CMOS voltage reference.
ISCAS (1) 2002: 717-720 |
| 35 | EE | Mohamed Hafed,
Gordon W. Roberts:
Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores.
ITC 2002: 1022-1030 |
| 34 | EE | Gordon W. Roberts:
Mixed-Signal BIST: Fact or Fiction.
ITC 2002: 1204 |
| 2001 |
|---|
| 33 | EE | G. D. Duerden,
Gordon W. Roberts,
M. Jamal Deen:
The development of bipolar log domain filters in a standard CMOS process.
ISCAS (1) 2001: 145-148 |
| 32 | EE | A. Aga,
Gordon W. Roberts:
A CMOS digitally programmable current steering semidigital FIR reconstruction filter.
ISCAS (1) 2001: 168-171 |
| 31 | EE | Christian Jesús B. Fayomi,
Gordon W. Roberts,
Mohamad Sawan:
A 1-V, 10-bit rail-to-rail successive approximation analog-to-digital converter in standard 0.18 um CMOS technology.
ISCAS (1) 2001: 460-463 |
| 30 | EE | Christian Jesús B. Fayomi,
Mohamad Sawan,
Gordon W. Roberts:
A design strategy for a 1-V rail-to-rail input/output CMOS opamp.
ISCAS (1) 2001: 639-642 |
| 29 | EE | C. K. L. Tam,
Gordon W. Roberts:
A robust DC current generation and measurement technique for deep submicron circuits.
ISCAS (1) 2001: 719-722 |
| 28 | EE | Nazmy Abaskharoun,
Mohamed Hafed,
Gordon W. Roberts:
Strategies for on-chip sub-nanosecond signal capture and timing measurements.
ISCAS (4) 2001: 174-177 |
| 27 | EE | N. Chandra,
Gordon W. Roberts:
Top-down analog design methodology using Matlab and Simulink.
ISCAS (5) 2001: 319-322 |
| 26 | | Mohamed Hafed,
Nazmy Abaskharoun,
Gordon W. Roberts:
A stand-alone integrated test core for time and frequency domain measurements.
ITC 2001: 1190-1199 |
| 25 | | Antonio H. Chan,
Gordon W. Roberts:
A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line.
ITC 2001: 858-867 |
| 2000 |
|---|
| 24 | | Mohamed Hafed,
Nazmy Abaskharoun,
Gordon W. Roberts:
A stand-alone integrated test core for time and frequency domain measurements.
ITC 2000: 1031-1040 |
| 1999 |
|---|
| 23 | EE | Mourad N. El-Gamal,
Gordon W. Roberts:
A 1.2 V NPN-only log-domain integrator.
ISCAS (2) 1999: 681-684 |
| 1998 |
|---|
| 22 | EE | Benoit Dufort,
Gordon W. Roberts:
Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques.
ITC 1998: 241-248 |
| 21 | EE | Ara Hajjar,
Gordon W. Roberts:
A high speed and area efficient on-chip analog waveform extractor.
ITC 1998: 688-697 |
| 20 | EE | Benoît R. Veillette,
Gordon W. Roberts:
Stimulus generation for built-in self-test of charge-pump phase-locked loops.
ITC 1998: 698- |
| 1997 |
|---|
| 19 | | Benoit Dufort,
Gordon W. Roberts:
Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams.
ITC 1997: 396-405 |
| 18 | | Benoît R. Veillette,
Gordon W. Roberts:
On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops.
ITC 1997: 776-785 |
| 1996 |
|---|
| 17 | EE | Gordon W. Roberts:
Metrics, techniques and recent developments in mixed-signal testing.
ICCAD 1996: 514-521 |
| 16 | | Evan M. Hawrysh,
Gordon W. Roberts:
An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures.
ITC 1996: 528-537 |
| 1995 |
|---|
| 15 | | Gordon W. Roberts:
Calculating Distortion Levels in Sampled-Data Circuits Using SPICE.
ISCAS 1995: 2059-2062 |
| 14 | | D. Perry,
Gordon W. Roberts:
Log-Domain Filters Based on LC Ladder Synthesis.
ISCAS 1995: 311-314 |
| 13 | | Benoît R. Veillette,
Gordon W. Roberts:
Bandpass Signal Generation Using Delta-Sigma Modulation Techniques.
ISCAS 1995: 637-640 |
| 12 | | Gordon W. Roberts:
Re-examining the Needs of the Mixed-Signal Test.
ITC 1995: 298 |
| 11 | | Xavier Haurie,
Gordon W. Roberts:
Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing.
ITC 1995: 78-86 |
| 10 | | Benoît R. Veillette,
Gordon W. Roberts:
A Bulti-in Self-Test Strategy for Wireless Communication Systems.
ITC 1995: 930-939 |
| 1994 |
|---|
| 9 | | Morie E. Malowany,
Gordon W. Roberts,
Vinod K. Agarwal:
VAMP: A Hierarchical Framework for Design for Manufacturability.
ISCAS 1994: 141-144 |
| 8 | | Peter M. Sinn,
Gordon W. Roberts:
A Comparison of First and Second Generation Switched-Current Cells.
ISCAS 1994: 301-304 |
| 7 | | A. K. Lu,
Gordon W. Roberts:
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications.
ITC 1994: 650-659 |
| 1993 |
|---|
| 6 | | I. Song,
Gordon W. Roberts:
A 5th Order Bilinear Switched-current Chebyshev Filter.
ISCAS 1993: 1097-1100 |
| 5 | | P. J. Crawley,
Gordon W. Roberts:
Predicting Harmonic Distortion in Switched-current Memory Circuits.
ISCAS 1993: 1243-1250 |
| 4 | | A. K. Lu,
Gordon W. Roberts,
David A. Johns:
A High-Quality Analog Oscillator Using Oversampling D/A Conversion Techniques.
ISCAS 1993: 1298-1301 |
| 3 | | P. J. Crawley,
Gordon W. Roberts:
Designing Operational Transconductance Amplifiers for Low Voltage Operation.
ISCAS 1993: 1455-1458 |
| 2 | | M. F. Toner,
Gordon W. Roberts:
Towards Built-In-Self-Test for SNR Testing of a Mixed-Signal IC.
ISCAS 1993: 1599-1602 |
| 1 | | M. F. Toner,
Gordon W. Roberts:
A BIST Scheme for an SNR Test of a Sigma-Delta ADC.
ITC 1993: 805-814 |
