Grzegorz Mrugalski

2008
19	EE	Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Neelanjan Mukherjee, Mark Kassab: X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 147-159 (2008)
18	EE	Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low-Power Test Data Application in EDT Environment Through Decompressor Freeze. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1278-1290 (2008)
2007
17	EE	Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer: New Test Data Decompressor for Low Power Applications. DAC 2007: 539-544
16	EE	Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Low Power Embedded Deterministic Test. VTS 2007: 75-83
15	EE	Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai: X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Design & Test of Computers 24(5): 476-485 (2007)
14	EE	Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer: Fault Diagnosis With Convolutional Compactors. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1478-1494 (2007)
13	EE	Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer: Isolation of Failing Scan Cells through Convolutional Test Response Compaction. J. Electronic Testing 23(1): 35-45 (2007)
2006
12	EE	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Test response compactor with programmable selector. DAC 2006: 1089-1094
11	EE	Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: High Performance Dense Ring Generators. IEEE Trans. Computers 55(1): 83-87 (2006)
2004
10	EE	Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski: Fault Diagnosis in Designs with Convolutional Compactors. ITC 2004: 498-507
9	EE	Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer: Planar High Performance Ring Generators. VTS 2004: 193-198
8	EE	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Ring generators - new devices for embedded test applications. IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1306-1320 (2004)
2003
7	EE	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: High Speed Ring Generators and Compactors of Test Data. VTS 2003: 57-62
6	EE	Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: 2D Test Sequence Generators. IEEE Design & Test of Computers 20(1): 51-59 (2003)
2002
5	EE	Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310
2000
4	EE	Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. VTS 2000: 377-388
3	EE	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer: Cellular automata-based test pattern generators with phase shifters. IEEE Trans. on CAD of Integrated Circuits and Systems 19(8): 878-893 (2000)
1999
2		Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski: Synthesis of pattern generators based on cellular automata with phase shifters. ITC 1999: 368-377
1	EE	Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer: Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters. VTS 1999: 236-245

Coauthor Index

1	Wu-Tung Cheng	[15] [19]
2	Dariusz Czysz	[16] [17] [18]
3	Geir Eide	[5]
4	Andre Hertwig	[5]
5	Mark Kassab	[5] [15] [19]
6	Liyang Lai	[15]
7	Neelanjan Mukherjee	[19]
8	Nilanjan Mukherjee	[5] [9] [11] [15]
9	Artur Pogiel	[10] [13] [14]
10	Jun Qian	[5]
11	Janusz Rajski	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19]
12	Manish Sharma	[15]
13	Nagesh Tamarapalli	[5]
14	Rob Thompson	[5]
15	Kun-Han Tsai	[5]
16	Jerzy Tyszer	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19]
17	Chen Wang	[10] [13]