2007 |
13 | EE | Alfred L. Crouch,
Phil Burlison,
Dennis J. Ciplickas:
Processing High Volume Scan Test Results for Yield Learning.
ISQED 2007: 293-298 |
12 | EE | Zahi S. Abuhamdeh,
Bob Hannagan,
Jeff Remmers,
Alfred L. Crouch:
A Production IR-Drop Screen on a Chip.
IEEE Design & Test of Computers 24(3): 216-224 (2007) |
2004 |
11 | EE | Alfred L. Crouch:
Future Trends in Test: The Adoption and Use of Low Cost Structural Testers.
ITC 2004: 698-703 |
2003 |
10 | EE | Alfred L. Crouch,
John C. Potter,
Jason Doege:
AC Scan Path Selection for Physical Debugging.
IEEE Design & Test of Computers 20(5): 34-40 (2003) |
2002 |
9 | EE | Alfred L. Crouch:
Testing the Tester: What Broke? Where? When? Why?
ITC 2002: 28 |
2000 |
8 | | Bahram Pouya,
Alfred L. Crouch:
Optimization trade-offs for vector volume and test power.
ITC 2000: 873-881 |
7 | EE | Alfred L. Crouch,
Michael Mateja,
Teresa L. McLaurin,
John C. Potter,
Dat Tran:
Test Development for a Third-Version ColdFire Microprocessor.
IEEE Design & Test of Computers 17(4): 29-37 (2000) |
1999 |
6 | | Alfred L. Crouch,
Michael Mateja,
Teresa L. McLaurin,
John C. Potter,
Dat Tran:
The testability features of the 3rd generation ColdFire family of microprocessors.
ITC 1999: 913-922 |
1998 |
5 | EE | Dale Amason,
Alfred L. Crouch,
Renny Eisele,
Grady Giles,
Michael Mateja:
Test Development for Second-Generation ColdFire Microprocessors.
IEEE Design & Test of Computers 15(3): 70-76 (1998) |
1997 |
4 | | Michael Mateja,
Alfred L. Crouch,
Renny Eisele,
Grady Giles,
Dale Amason:
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.
ITC 1997: 424-432 |
1994 |
3 | | Alfred L. Crouch,
Matthew Pressly,
Joe Circello:
Testabilty Features of the MC 68060 Microprocessor.
ITC 1994: 60-69 |
2 | | Alfred L. Crouch,
Rick Ramus,
Colin Maunder:
Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution.
ITC 1994: 660-669 |
1989 |
1 | | Andy Halliday,
Greg Young,
Alfred L. Crouch:
Prototype Testing Simplified by Scannable Buffers and Latches.
ITC 1989: 174-181 |