2008 |
30 | EE | Alfredo Benso,
Stefano Di Carlo,
Gianfranco Politano,
Luca Sterpone:
Differential gene expression graphs: A data structure for classification in DNA microarrays.
BIBE 2008: 1-6 |
29 | EE | Alfredo Benso,
Stefano Di Carlo,
Gianfranco Politano,
Luca Sterpone:
A graph-based representation of Gene Expression profiles in DNA microarrays.
CIBCB 2008: 75-82 |
28 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
March Test Generation Revealed.
IEEE Trans. Computers 57(12): 1704-1713 (2008) |
27 | EE | Alfredo Benso,
Stefano Di Carlo,
Paolo Prinetto,
Yervant Zorian:
IEEE Standard 1500 Compliance Verification for Embedded Cores.
IEEE Trans. VLSI Syst. 16(4): 397-407 (2008) |
2007 |
26 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Riccardo Mariani:
A Functional Verification Based Fault Injection Environment.
DFT 2007: 114-122 |
25 | EE | Mohammad Hosseinabady,
Mohammad Hossein Neishaburi,
Zainalabedin Navabi,
Alfredo Benso,
Stefano Di Carlo,
Paolo Prinetto,
Giorgio Di Natale:
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC.
IOLTS 2007: 205-206 |
2006 |
24 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Automatic march tests generations for static linked faults in SRAMs.
DATE 2006: 1258-1263 |
23 | | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs.
DDECS 2006: 157-158 |
22 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Automatic March Tests Generation for Multi-Port SRAMs.
DELTA 2006: 385-392 |
21 | EE | Mohammad Hosseinabady,
Pejman Lotfi-Kamran,
Giorgio Di Natale,
Stefano Di Carlo,
Alfredo Benso,
Paolo Prinetto:
Single-Event Upset Analysis and Protection in High Speed Circuits.
European Test Symposium 2006: 29-34 |
20 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
A 22n March Test for Realistic Static Linked Faults in SRAMs.
European Test Symposium 2006: 49-54 |
2004 |
19 | EE | Marie-Lise Flottes,
Yves Bertrand,
L. Balado,
E. Lupon,
Anton Biasizzo,
Franc Novak,
Stefano Di Carlo,
Paolo Prinetto,
N. Pricopi,
Hans-Joachim Wunderlich:
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ.
DELTA 2004: 135-139 |
2003 |
18 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
A Watchdog Processor to Detect Data and Control Flow Errors.
IOLTS 2003: 144-148 |
17 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
I. Solcia,
Luca Tagliaferri:
FAUST: FAUlt-injection Script-based Tool.
IOLTS 2003: 160 |
16 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
Luca Tagliaferri:
Data Critically Estimation In Software Applications.
ITC 2003: 802-810 |
15 | EE | Yves Bertrand,
Marie-Lise Flottes,
L. Balado,
Joan Figueras,
Anton Biasizzo,
Franc Novak,
Stefano Di Carlo,
Paolo Prinetto,
N. Pricopi,
Hans-Joachim Wunderlich,
J.-P. Van der Heyden:
Test Engineering Education in Europe: the EuNICE-Test Project.
MSE 2003: 85-86 |
14 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Online Self-Repair of FIR Filters.
IEEE Design & Test of Computers 20(3): 50-57 (2003) |
13 | EE | Alfredo Benso,
Stefano Di Carlo,
Paolo Prinetto,
Yervant Zorian:
A Hierarchical Infrastructure for SoC Test Management.
IEEE Design & Test of Computers 20(4): 32-39 (2003) |
2002 |
12 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Specification and Design of a New Memory Fault Simulator.
Asian Test Symposium 2002: 92-97 |
11 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
An Optimal Algorithm for the Automatic Generation of March Tests.
DATE 2002: 938-943 |
10 | EE | Silvia Chiusano,
Stefano Di Carlo,
Paolo Prinetto:
Automated Synthesis of SEU Tolerant Architectures from OO Descriptions.
IOLTW 2002: 26-31 |
9 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Static Analysis of SEU Effects on Software Applications.
ITC 2002: 500-508 |
2001 |
8 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Memory Read Faults: Taxonomy and Automatic Test Generation.
Asian Test Symposium 2001: 157-163 |
7 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
Luca Tagliaferri:
Control-Flow Checking via Regular Expressions.
Asian Test Symposium 2001: 299-303 |
6 | EE | Silvia Chiusano,
Stefano Di Carlo,
Paolo Prinetto,
Hans-Joachim Wunderlich:
On applying the set covering model to reseeding.
DATE 2001: 156-161 |
5 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
SEU effect analysis in an open-source router via a distributed fault injection environment.
DATE 2001: 219-225 |
4 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Luca Tagliaferri,
Paolo Prinetto:
Validation of a Software Dependability Tool via Fault Injection Experiments.
IOLTW 2001: 3-8 |
2000 |
3 | EE | Alfredo Benso,
Stefano Di Carlo,
Silvia Chiusano,
Paolo Prinetto,
Fabio Ricciato,
Monica Lobetti Bodoni,
Maurizio Spadari:
On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs.
ICCD 2000: 539-540 |
2 | | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
Monica Lobetti Bodoni:
A programmable BIST architecture for clusters of multiple-port SRAMs.
ITC 2000: 557-566 |
1 | | Alfredo Benso,
Silvia Chiusano,
Stefano Di Carlo,
Paolo Prinetto,
Fabio Ricciato,
Maurizio Spadari,
Yervant Zorian:
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs.
ITC 2000: 892-901 |