| 2007 |
|---|
| 13 | EE | Huaxing Tang,
Manish Sharma,
Janusz Rajski,
Martin Keim,
Brady Benware:
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement.
European Test Symposium 2007: 145-150 |
| 12 | EE | Chris Schuermyer,
Jewel Pangilinan,
Jay Jahangiri,
Martin Keim,
Janusz Rajski,
Brady Benware:
Silicon Evaluation of Static Alternative Fault Models.
VTS 2007: 265-270 |
| 2006 |
|---|
| 11 | EE | Ritesh P. Turakhia,
W. Robert Daasch,
Joel Lurkins,
Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers.
IEEE Design & Test of Computers 23(2): 100-109 (2006) |
| 10 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Jason G. Brown,
Osei Poku,
R. D. (Shawn) Blanton,
Wojciech Maly,
Brady Benware,
Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs.
IEEE Design & Test of Computers 23(5): 390-400 (2006) |
| 2005 |
|---|
| 9 | EE | Ritesh P. Turakhia,
Brady Benware,
Robert Madge,
Thaddeus T. Shannon,
W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ.
VTS 2005: 427-432 |
| 2004 |
|---|
| 8 | EE | Brady Benware,
Cam Lu,
John Van Slyke,
Prabhu Krishnamurthy,
Robert Madge,
Martin Keim,
Mark Kassab,
Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.
ITC 2004: 1285-1294 |
| 7 | EE | Brady Benware:
Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs.
ITC 2004: 1418 |
| 6 | EE | Robert Madge,
Brady Benware,
Ritesh P. Turakhia,
W. Robert Daasch,
Chris Schuermyer,
Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.
ITC 2004: 203-212 |
| 5 | EE | Ethan Long,
W. Robert Daasch,
Robert Madge,
Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC.
VTS 2004: 185-192 |
| 2003 |
|---|
| 4 | EE | Brady Benware,
Chris Schuermyer,
Sreenevasan Ranganathan,
Robert Madge,
Prabhu Krishnamurthy,
Nagesh Tamarapalli,
Kun-Han Tsai,
Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality.
ITC 2003: 1031-1040 |
| 3 | EE | Chris Schuermyer,
Brady Benware,
Kevin Cota,
Robert Madge,
W. Robert Daasch,
L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.
ITC 2003: 565-573 |
| 2 | EE | Brady Benware,
Robert Madge,
Cam Lu,
W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.
VTS 2003: 39-46 |
| 1 | EE | Robert Madge,
Brady Benware,
W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs.
IEEE Design & Test of Computers 20(5): 46-53 (2003) |
