| 2004 |
|---|
| 8 | EE | Stephen K. Sunter,
Adam Osseiran,
Adam Cron,
Neil Jacobson,
Dave Bonnett,
Bill Eklow,
Carl Barnhart,
Ben Bennetts:
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.
DATE 2004: 1184-1191 |
| 2003 |
|---|
| 7 | EE | Bill Eklow,
Carl Barnhart,
Mike Ricchetti,
Terry Borroz:
IEEE 1149.6 - A Practical Perspective.
ITC 2003: 494-502 |
| 6 | EE | Bill Eklow,
Carl Barnhart,
Kenneth P. Parker:
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks.
IEEE Design & Test of Computers 20(5): 76-83 (2003) |
| 2002 |
|---|
| 5 | EE | Bill Eklow,
Carl Barnhart,
Kenneth P. Parker:
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks.
ITC 2002: 1056-1065 |
| 4 | EE | Carl Barnhart,
Vanessa Brunkhorst,
Frank Distler,
Owen Farnsworth,
Andrew Ferko,
Brion L. Keller,
David Scott,
Bernd Könemann,
Takeshi Onodera:
Extending OPMISR beyond 10x Scan Test Efficiency.
IEEE Design & Test of Computers 19(5): 65-72 (2002) |
| 2001 |
|---|
| 3 | EE | Bernd Könemann,
Carl Barnhart,
Brion L. Keller,
Thomas J. Snethen,
Owen Farnsworth,
Donald L. Wheater:
A SmartBIST Variant with Guaranteed Encoding.
Asian Test Symposium 2001: 325- |
| 2 | | Carl Barnhart,
Vanessa Brunkhorst,
Frank Distler,
Owen Farnsworth,
Brion L. Keller,
Bernd Könemann,
Andrej Ferko:
OPMISR: the foundation for compressed ATPG vectors.
ITC 2001: 748-757 |
| 2000 |
|---|
| 1 | EE | Vivek Chickermane,
Scott Richter,
Carl Barnhart:
Integrating Logic BIST in VLSI Designs with Embedded Memories.
VTS 2000: 157-164 |
