| |
| 2003 | ||
|---|---|---|
| 3 | EE | Bradford G. Van Treuren, José M. Miranda: Embedded Boundary Scan. IEEE Design & Test of Computers 20(2): 20-25 (2003) |
| 1998 | ||
| 2 | EE | José M. Miranda, Scott Davidson, Peter Dziel, Saman Adham, Steve Millman: Test Reuse at System Level. VTS 1998: 318-319 |
| 1997 | ||
| 1 | EE | José M. Miranda: A BIST and Boundary-Scan Economics Framework. IEEE Design & Test of Computers 14(3): 17-23 (1997) |
| 1 | Saman Adham | [2] |
| 2 | Scott Davidson | [2] |
| 3 | Peter Dziel | [2] |
| 4 | Steve Millman | [2] |
| 5 | Bradford G. Van Treuren | [3] |