Marcelo Negreiros

2007
20	EE	Erik Schüler, Marcelo Negreiros, Pascal Nouet, Luigi Carro: A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. European Test Symposium 2007: 21-28
19	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Digital Generation of Signals for Low Cost RF BIST. European Test Symposium 2007: 49-54
18	EE	Marcelo Negreiros, Adão Antônio de Souza Jr., Luigi Carro, Altamiro Amadeu Susin: RF Digital Signal Generation Beyond Nyquist. VTS 2007: 15-22
17	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Noise Figure Evaluation Using Low Cost BIST CoRR abs/0710.4718: (2007)
16	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Reducing Test Time Using an Enhanced RF Loopback. J. Electronic Testing 23(6): 613-623 (2007)
2006
15	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: An improved RF loopback for test time reduction. DATE 2006: 646-651
2005
14	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Noise Figure Evaluation Using Low Cost BIST. DATE 2005: 158-163
13	EE	Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento: Low Cost BIST for Static and Dynamic Testing of ADCs. J. Electronic Testing 21(3): 283-290 (2005)
12	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Low Cost On-Line Testing Strategy for RF Circuits. J. Electronic Testing 21(4): 417-427 (2005)
2004
11	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Low Cost Analog Testing of RF Signal Paths. DATE 2004: 292-297
10	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Low Cost On-Line Testing of RF Circuits. IOLTS 2004: 73-78
2003
9	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Ultimate low cost analog BIST. DAC 2003: 570-573
8	EE	Marcelo Negreiros, Erik Schüler, Luigi Carro, Altamiro Amadeu Susin: Testing RF Signal Paths Using Spectral Analysis and Subsampling. SBCCI 2003: 329-
7	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Ultra Low Cost Analog BIST Using Spectral Analysis. VTS 2003: 77-82
6	EE	Luigi Carro, Marcelo Negreiros, Gabriel Parmegiani Jahn, Adão Antônio de Souza Jr., Denis Teixeira Franco: Circuit-Level Considerations for Mixed-Signal Programmable Components. IEEE Design & Test of Computers 20(1): 76-84 (2003)
5	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: A Statistical Sampler for a New On-Line Analog Test Method. J. Electronic Testing 19(5): 585-595 (2003)
4	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: Testing analog circuits using spectral analysis. Microelectronics Journal 34(10): 937-944 (2003)
2002
3	EE	Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin: A Statistical Sampler for a New On-line Analog Test Method. IOLTW 2002: 79-
2000
2	EE	Luigi Carro, Adão Antônio de Souza Jr., Marcelo Negreiros, Gabriel Parmegiani Jahn, Denis Teixeira Franco: Non-Linear Components for Mixed Circuits Analog Front-End. DATE 2000: 544-
1998
1	EE	Luigi Carro, Marcelo Negreiros: Efficient Analog Test Methodology Based on Adaptive Algorithms. DAC 1998: 32-37

Coauthor Index

1	Cristiano Benevento	[13]
2	Luigi Carro	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20]
3	Felipe R. Clayton	[13]
4	Maria Da Gloria Flores	[13]
5	Denis Teixeira Franco	[2] [6]
6	Gabriel Parmegiani Jahn	[2] [6]
7	Pascal Nouet	[20]
8	Erik Schüler	[8] [20]
9	Adão Antônio de Souza Jr.	[2] [6] [18]
10	Altamiro Amadeu Susin	[3] [4] [5] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19]