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2004 | ||
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4 | EE | Md. Saffat Quasem, Sandeep K. Gupta: Designing Reconfigurable Multiple Scan Chains for Systems-on-Chip. VTS 2004: 367-376 |
2003 | ||
3 | EE | Md. Saffat Quasem, Sandeep K. Gupta: Designing Multiple Scan Chains for Systems-on-Chip. Asian Test Symposium 2003: 424-427 |
2 | EE | Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta: Benefits of a SoC-Specific Test Methodology. IEEE Design & Test of Computers 20(3): 68-77 (2003) |
2001 | ||
1 | EE | Md. Saffat Quasem, Sandeep K. Gupta: Exact fault simulation for systems on Silicon that protects each core's intellectual property. DATE 2001: 804 |
1 | Sandeep K. Gupta | [1] [2] [3] [4] |
2 | Zhigang Jiang | [2] |