| 2003 |
|---|
| 4 | EE | Darren Anand,
Bruce Cowan,
Owen Farnsworth,
Peter Jakobsen,
Steven F. Oakland,
Michael Ouellette,
Donald L. Wheater:
An On-Chip Self-Repair Calculation and Fusing Methodology.
IEEE Design & Test of Computers 20(5): 67-75 (2003) |
| 2002 |
|---|
| 3 | EE | Bruce Cowan,
Owen Farnsworth,
Peter Jakobsen,
Steven F. Oakland,
Michael Ouellette,
Donald L. Wheater:
On-Chip Repair and an ATE Independent Fusing Methodology.
ITC 2002: 178-186 |
| 2 | EE | John E. Barth Jr.,
Jeffrey Dreibelbis,
Eric A. Nelson,
Darren Anand,
Gary Pomichter,
Peter Jakobsen,
Michael R. Nelms,
Jeffrey Leach,
George M. Belansek:
Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering.
IBM Journal of Research and Development 46(6): 675-690 (2002) |
| 2001 |
|---|
| 1 | | Peter Jakobsen,
Jeffrey Dreibelbis,
Gary Pomichter,
Darren Anand,
John E. Barth Jr.,
Michael R. Nelms,
Jeffrey Leach,
George M. Belansek:
Embedded DRAM built in self test and methodology for test insertion.
ITC 2001: 975-984 |
