Donald L. Wheater

2003
13	EE	Donald L. Wheater: ATE-Customer Perspectives & Requirements Panel. ITC 2003: 1298
12	EE	Darren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater: An On-Chip Self-Repair Calculation and Fusing Methodology. IEEE Design & Test of Computers 20(5): 67-75 (2003)
2002
11	EE	Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater: On-Chip Repair and an ATE Independent Fusing Methodology. ITC 2002: 178-186
10	EE	Lee Song, Rudy Garcia, Andrew Levy, Donald L. Wheater: A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required? VTS 2002: 87-90
9	EE	Robert C. Aitken, Donald L. Wheater: Guest Editors' Introduction: Stressing the Fundamentals. IEEE Design & Test of Computers 19(5): 54-55 (2002)
2001
8	EE	Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater: A SmartBIST Variant with Guaranteed Encoding. Asian Test Symposium 2001: 325-
7		Tony Ambler, Donald L. Wheater: Test Trade-Offs Take Center Stage at ITC. IEEE Design & Test of Computers 18(5): 59- (2001)
1997
6	EE	Melvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater: Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS 1997: 186-187
1994
5		Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix: ASIC Test Cost/Strategy Trade-offs. ITC 1994: 93-102
1990
4	EE	Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater: Low-Cost Testing of High-Density Logic Components. IEEE Design & Test of Computers 7(2): 15-28 (1990)
1989
3		Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater: Low Cost Testing of High Density Logic Components. ITC 1989: 550-557
1984
2		Donald L. Wheater: IBM's Cost Performance Array Tester Architecture for the 80's. ITC 1984: 466-470
1981
1		Donald L. Wheater, Richard Soderman: The Series/1 as a Test System Controller for System Verification and Calibration. ITC 1981: 377-380

Coauthor Index

1	Robert C. Aitken	[9]
2	Tony Ambler	[7]
3	Darren Anand	[12]
4	Carl Barnhart	[8]
5	Robert W. Bassett	[3] [4]
6	Melvin A. Breuer	[6]
7	Barry J. Butkus	[3] [4]
8	Bruce Cowan	[11] [12]
9	Stephen L. Dingle	[3] [4]
10	Owen Farnsworth	[8] [11] [12]
11	Marc R. Faucher	[3] [4]
12	Rudy Garcia	[10]
13	Pamela S. Gillis	[3] [4]
14	Peter Jakobsen	[11] [12]
15	Bozena Kaminska	[6]
16	Brion L. Keller	[8]
17	Bernd Könemann	[8]
18	Luke Lacroix	[5]
19	Andrew Levy	[10]
20	J. McDermid	[6]
21	Jeanne Trinko Mechler	[5]
22	Phil Nigh	[5]
23	Steven F. Oakland	[11] [12]
24	Michael Ouellette	[11] [12]
25	Jeannie H. Panner	[3] [4]
26	John G. Petrovick	[3] [4]
27	V. Rayapathi	[6]
28	Thomas J. Snethen	[8]
29	Richard Soderman	[1]
30	Lee Song	[10]

Colors in the list of coauthors