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Donald L. Wheater

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2003
13EEDonald L. Wheater: ATE-Customer Perspectives & Requirements Panel. ITC 2003: 1298
12EEDarren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater: An On-Chip Self-Repair Calculation and Fusing Methodology. IEEE Design & Test of Computers 20(5): 67-75 (2003)
2002
11EEBruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater: On-Chip Repair and an ATE Independent Fusing Methodology. ITC 2002: 178-186
10EELee Song, Rudy Garcia, Andrew Levy, Donald L. Wheater: A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required? VTS 2002: 87-90
9EERobert C. Aitken, Donald L. Wheater: Guest Editors' Introduction: Stressing the Fundamentals. IEEE Design & Test of Computers 19(5): 54-55 (2002)
2001
8EEBernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater: A SmartBIST Variant with Guaranteed Encoding. Asian Test Symposium 2001: 325-
7 Tony Ambler, Donald L. Wheater: Test Trade-Offs Take Center Stage at ITC. IEEE Design & Test of Computers 18(5): 59- (2001)
1997
6EEMelvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater: Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS 1997: 186-187
1994
5 Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix: ASIC Test Cost/Strategy Trade-offs. ITC 1994: 93-102
1990
4EERobert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater: Low-Cost Testing of High-Density Logic Components. IEEE Design & Test of Computers 7(2): 15-28 (1990)
1989
3 Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater: Low Cost Testing of High Density Logic Components. ITC 1989: 550-557
1984
2 Donald L. Wheater: IBM's Cost Performance Array Tester Architecture for the 80's. ITC 1984: 466-470
1981
1 Donald L. Wheater, Richard Soderman: The Series/1 as a Test System Controller for System Verification and Calibration. ITC 1981: 377-380

Coauthor Index

1Robert C. Aitken [9]
2Tony Ambler [7]
3Darren Anand [12]
4Carl Barnhart [8]
5Robert W. Bassett [3] [4]
6Melvin A. Breuer [6]
7Barry J. Butkus [3] [4]
8Bruce Cowan [11] [12]
9Stephen L. Dingle [3] [4]
10Owen Farnsworth [8] [11] [12]
11Marc R. Faucher [3] [4]
12Rudy Garcia [10]
13Pamela S. Gillis [3] [4]
14Peter Jakobsen [11] [12]
15Bozena Kaminska [6]
16Brion L. Keller [8]
17Bernd Könemann [8]
18Luke Lacroix [5]
19Andrew Levy [10]
20J. McDermid [6]
21Jeanne Trinko Mechler [5]
22Phil Nigh [5]
23Steven F. Oakland [11] [12]
24Michael Ouellette [11] [12]
25Jeannie H. Panner [3] [4]
26John G. Petrovick [3] [4]
27V. Rayapathi [6]
28Thomas J. Snethen [8]
29Richard Soderman [1]
30Lee Song [10]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)