| 2008 |
|---|
| 58 | EE | Alfredo Benso,
Stefano Di Carlo,
Gianfranco Politano,
Luca Sterpone:
Differential gene expression graphs: A data structure for classification in DNA microarrays.
BIBE 2008: 1-6 |
| 57 | EE | Alfredo Benso,
Stefano Di Carlo,
Gianfranco Politano,
Luca Sterpone:
A graph-based representation of Gene Expression profiles in DNA microarrays.
CIBCB 2008: 75-82 |
| 56 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
March Test Generation Revealed.
IEEE Trans. Computers 57(12): 1704-1713 (2008) |
| 55 | EE | Alfredo Benso,
Stefano Di Carlo,
Paolo Prinetto,
Yervant Zorian:
IEEE Standard 1500 Compliance Verification for Embedded Cores.
IEEE Trans. VLSI Syst. 16(4): 397-407 (2008) |
| 2007 |
|---|
| 54 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Riccardo Mariani:
A Functional Verification Based Fault Injection Environment.
DFT 2007: 114-122 |
| 53 | EE | Mohammad Hosseinabady,
Mohammad Hossein Neishaburi,
Zainalabedin Navabi,
Alfredo Benso,
Stefano Di Carlo,
Paolo Prinetto,
Giorgio Di Natale:
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC.
IOLTS 2007: 205-206 |
| 2006 |
|---|
| 52 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Automatic march tests generations for static linked faults in SRAMs.
DATE 2006: 1258-1263 |
| 51 | | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs.
DDECS 2006: 157-158 |
| 50 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Automatic March Tests Generation for Multi-Port SRAMs.
DELTA 2006: 385-392 |
| 49 | EE | Mohammad Hosseinabady,
Pejman Lotfi-Kamran,
Giorgio Di Natale,
Stefano Di Carlo,
Alfredo Benso,
Paolo Prinetto:
Single-Event Upset Analysis and Protection in High Speed Circuits.
European Test Symposium 2006: 29-34 |
| 48 | EE | Alfredo Benso,
Alberto Bosio,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
A 22n March Test for Realistic Static Linked Faults in SRAMs.
European Test Symposium 2006: 49-54 |
| 2005 |
|---|
| 47 | EE | Andrea Baldini,
Alfredo Benso,
Paolo Prinetto:
A Dependable Autonomic Computing Environment for Self-Testing of Complex Heterogeneous Systems.
Electr. Notes Theor. Comput. Sci. 116: 47-57 (2005) |
| 46 | EE | Liviu Miclea,
Szilárd Enyedi,
Paolo Prinetto,
Alfredo Benso:
Agent-based test and repair of distributed systems.
J. Embedded Computing 1(3): 405-414 (2005) |
| 45 | EE | Andrea Baldini,
Alfredo Benso,
Paolo Prinetto:
System-level functional testing from UML specifications in end-of-production industrial environments.
STTT 7(4): 326-340 (2005) |
| 2004 |
|---|
| 44 | EE | Liviu Miclea,
Szilárd Enyedi,
Gavril Toderean,
Alfredo Benso,
Paolo Prinetto:
Towards Microagent based DBIST/DBISR.
ITC 2004: 867-874 |
| 43 | | Paolo Prinetto,
Alfredo Benso:
Test Technology TC Newsletter.
IEEE Design & Test of Computers 21(2): 164-165 (2004) |
| 2003 |
|---|
| 42 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
A Watchdog Processor to Detect Data and Control Flow Errors.
IOLTS 2003: 144-148 |
| 41 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
I. Solcia,
Luca Tagliaferri:
FAUST: FAUlt-injection Script-based Tool.
IOLTS 2003: 160 |
| 40 | EE | Alfredo Benso:
Self-Testing and Self-Healing via Mobile Agents.
ITC 2003: 1320 |
| 39 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
Luca Tagliaferri:
Data Critically Estimation In Software Applications.
ITC 2003: 802-810 |
| 38 | EE | Liviu Miclea,
Szilárd Enyedi,
Gavril Toderean,
Alfredo Benso,
Paolo Prinetto:
Agent Based DBIST/DBISR And Its Web/Wireless Management.
ITC 2003: 952-960 |
| 37 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Online Self-Repair of FIR Filters.
IEEE Design & Test of Computers 20(3): 50-57 (2003) |
| 36 | EE | Alfredo Benso,
Stefano Di Carlo,
Paolo Prinetto,
Yervant Zorian:
A Hierarchical Infrastructure for SoC Test Management.
IEEE Design & Test of Computers 20(4): 32-39 (2003) |
| 2002 |
|---|
| 35 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Specification and Design of a New Memory Fault Simulator.
Asian Test Symposium 2002: 92-97 |
| 34 | EE | Andrea Baldini,
Alfredo Benso,
Paolo Prinetto,
Sergio Mo,
Andrea Taddei:
Beyond UML to an End-of-Line Functional Test Engine.
DATE 2002: 499-505 |
| 33 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
An Optimal Algorithm for the Automatic Generation of March Tests.
DATE 2002: 938-943 |
| 32 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Static Analysis of SEU Effects on Software Applications.
ITC 2002: 500-508 |
| 31 | EE | Andrea Baldini,
Alfredo Benso,
Paolo Prinetto,
Sergio Mo,
Andrea Taddei:
Efficient Design of System Test: A Layered Architecture.
ITC 2002: 930-939 |
| 30 | EE | Liviu Miclea,
Szilárd Enyedi,
Alfredo Benso:
Itelligent Agents and BIST/BISR - Working Together in Distributed Systems.
ITC 2002: 940-946 |
| 29 | EE | Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto:
DFT and BIST of a Multichip Module for High-Energy Physics Experiments.
IEEE Design & Test of Computers 19(3): 94-105 (2002) |
| 2001 |
|---|
| 28 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
Memory Read Faults: Taxonomy and Automatic Test Generation.
Asian Test Symposium 2001: 157-163 |
| 27 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
Luca Tagliaferri:
Control-Flow Checking via Regular Expressions.
Asian Test Symposium 2001: 299-303 |
| 26 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto:
SEU effect analysis in an open-source router via a distributed fault injection environment.
DATE 2001: 219-225 |
| 25 | EE | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Luca Tagliaferri,
Paolo Prinetto:
Validation of a Software Dependability Tool via Fault Injection Experiments.
IOLTW 2001: 3-8 |
| 24 | | Andrea Baldini,
Alfredo Benso,
Paolo Prinetto,
Sergio Mo,
Andrea Taddei:
Towards a unified test process: from UML to end-of-line functional test.
ITC 2001: 600-608 |
| 23 | EE | Alfredo Benso,
Silvia Chiusano,
Giorgio Di Natale,
Paolo Prinetto,
Monica Lobetti Bodoni:
Online and Offline BIST in IP-Core Design.
IEEE Design & Test of Computers 18(5): 92-99 (2001) |
| 22 | EE | Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto:
A Self-Repairing Execution Unit for Microprogrammed Processors.
IEEE Micro 21(5): 16-22 (2001) |
| 2000 |
|---|
| 21 | EE | Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto,
P. Simonotti,
G. Ugo:
Self-Repairing in a Micro-Programmed Processor for Dependable Applications.
DFT 2000: 231-239 |
| 20 | EE | Andrea Baldini,
Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto:
'BOND': An Interposition Agents Based Fault Injector for Windows NT.
DFT 2000: 387-395 |
| 19 | EE | Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto,
Luca Tagliaferri:
A C/C++ Source-to-Source Compiler for Dependable Applications.
DSN 2000: 71- |
| 18 | EE | Alfredo Benso,
Stefano Martinetto,
Paolo Prinetto,
Riccardo Mariani:
An SEU Injection Tool to Evaluate DSP-Based Architectures for Space Applications.
ICCD 2000: 537-538 |
| 17 | EE | Alfredo Benso,
Stefano Di Carlo,
Silvia Chiusano,
Paolo Prinetto,
Fabio Ricciato,
Monica Lobetti Bodoni,
Maurizio Spadari:
On Integrating a Proprietary and a Commercial Architecture for Optimal BIST Performances in SoCs.
ICCD 2000: 539-540 |
| 16 | EE | Alfredo Benso,
Silvia Chiusano,
Giorgio Di Natale,
Paolo Prinetto,
Monica Lobetti Bodoni:
A Family of Self-Repair SRAM Cores.
IOLTW 2000: 214-218 |
| 15 | EE | Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto:
A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT.
IOLTW 2000: 9-16 |
| 14 | | Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto:
A software development kit for dependable applications in embedded systems.
ITC 2000: 170-178 |
| 13 | | Alfredo Benso,
Stefano Di Carlo,
Giorgio Di Natale,
Paolo Prinetto,
Monica Lobetti Bodoni:
A programmable BIST architecture for clusters of multiple-port SRAMs.
ITC 2000: 557-566 |
| 12 | | Alfredo Benso,
Silvia Chiusano,
Stefano Di Carlo,
Paolo Prinetto,
Fabio Ricciato,
Maurizio Spadari,
Yervant Zorian:
HD/sup 2/BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs.
ITC 2000: 892-901 |
| 11 | EE | Alfredo Benso,
Silvia Cataldo,
Silvia Chiusano,
Paolo Prinetto,
Yervant Zorian:
A High-Level EDA Environment for the Automatic Insertion of HD-BIST Structures.
J. Electronic Testing 16(3): 179-184 (2000) |
| 1999 |
|---|
| 10 | | Alfredo Benso,
Silvia Cataldo,
Silvia Chiusano,
Paolo Prinetto,
Yervant Zorian:
HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs.
ITC 1999: 1038-1044 |
| 9 | | Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto,
Simone Giovannetti,
Riccardo Mariani,
Silvano Motto:
Testing an MCM for high-energy physics experiments: a case study.
ITC 1999: 38-46 |
| 8 | | Monica Lobetti Bodoni,
Alessio Pricco,
Alfredo Benso,
Silvia Chiusano,
Paolo Prinetto:
An on-line BISTed SRAM IP core.
ITC 1999: 993-1000 |
| 7 | EE | Alfredo Benso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
FlexFi: A Flexible Fault Injection Environment for Microprocessor-Based Systems.
SAFECOMP 1999: 323-335 |
| 6 | EE | Alfredo Benso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Fault Injection for Embedded Microprocessor-based Systems.
J. UCS 5(10): 693-711 (1999) |
| 1998 |
|---|
| 5 | EE | Alfredo Benso,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Pierluigi Civera:
An Integrated HW and SW Fault Injection Environment for Real-Time Systems.
DFT 1998: 117- |
| 4 | EE | Alfredo Benso,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A fault injection environment for microprocessor-based boards.
ITC 1998: 768-773 |
| 3 | EE | Alfredo Benso,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
EXFI: a low-cost fault injection system for embedded microprocessor-based boards.
ACM Trans. Design Autom. Electr. Syst. 3(4): 626-634 (1998) |
| 1997 |
|---|
| 2 | EE | Alfredo Benso,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Jaan Raik,
Raimund Ubar:
Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments.
DFT 1997: 212-217 |
| 1 | EE | Alfredo Benso,
Paolo Prinetto,
Maurizio Rebaudengo,
Matteo Sonza Reorda,
Raimund Ubar:
A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs.
ED&TC 1997: 560-565 |
