2006 |
14 | EE | Bill Eklow,
Ben Bennetts:
New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG).
European Test Symposium 2006: 253-254 |
2004 |
13 | EE | Stephen K. Sunter,
Adam Osseiran,
Adam Cron,
Neil Jacobson,
Dave Bonnett,
Bill Eklow,
Carl Barnhart,
Ben Bennetts:
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.
DATE 2004: 1184-1191 |
12 | EE | Bill Eklow:
IP Testing - The Future Differentiator?
DATE 2004: 6-9 |
11 | EE | Sunil Kalidindi,
Nghia Huynh,
Bill Eklow,
Josh Goldstein:
"Real Life" System Testing of Networking Equipment.
ITC 2004: 1072-1077 |
10 | EE | Bill Eklow:
What Do You Mean My Board Test Stinks?
ITC 2004: 1423 |
9 | EE | Xinli Gu,
Cyndee Wang,
Abby Lee,
Bill Eklow,
Kun-Han Tsai,
Jan Arild Tofte,
Mark Kassab,
Janusz Rajski:
Realizing High Test Quality Goals with Smart Test Resource Usage.
ITC 2004: 525-533 |
8 | EE | Bill Eklow,
Anoosh Hosseini,
Chi Khuong,
Shyam Pullela,
Toai Vo,
Hien Chau:
Simulation Based System Level Fault Insertion Using Co-verification Tools.
ITC 2004: 704-710 |
2003 |
7 | EE | Bill Eklow,
Carl Barnhart,
Mike Ricchetti,
Terry Borroz:
IEEE 1149.6 - A Practical Perspective.
ITC 2003: 494-502 |
6 | EE | Bill Eklow,
Carl Barnhart,
Kenneth P. Parker:
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks.
IEEE Design & Test of Computers 20(5): 76-83 (2003) |
2002 |
5 | EE | Bill Eklow,
Carl Barnhart,
Kenneth P. Parker:
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks.
ITC 2002: 1056-1065 |
4 | EE | Bill Eklow:
Is Board Test Worth Talking About?
ITC 2002: 1235 |
2001 |
3 | | William Eklow,
Richard M. Sedmak,
Dan Singletary,
Toai Vo:
Unsafe board states during PC-based boundary-scan testing.
ITC 2001: 615-623 |
1998 |
2 | EE | Bulent I. Dervisoglu,
Mike Ricchetti,
William Eklow:
Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard.
ITC 1998: 980- |
1994 |
1 | | William Eklow:
Optimizing Boundary Scan in a Proprietary Environment.
ITC 1994: 1024 |