| 2006 |
|---|
| 8 | EE | Manan Syal,
Michael S. Hsiao:
New techniques for untestable fault identification in sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1117-1131 (2006) |
| 2005 |
|---|
| 7 | EE | Vishnu C. Vimjam,
Manan Syal,
Michael S. Hsiao:
Untestable fault identification through enhanced necessary value assignments.
ACM Great Lakes Symposium on VLSI 2005: 176-181 |
| 6 | EE | Manan Syal,
Michael S. Hsiao,
Suriyaprakash Natarajan,
Sreejit Chakravarty:
Untestable Multi-Cycle Path Delay Faults in Industrial Designs.
Asian Test Symposium 2005: 194-201 |
| 5 | EE | Manan Syal,
Rajat Arora,
Michael S. Hsiao:
Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults.
ICCD 2005: 453-460 |
| 2004 |
|---|
| 4 | EE | Manan Syal,
Michael S. Hsiao,
Sreejit Chakravarty:
Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks.
ITC 2004: 1034-1043 |
| 3 | EE | Manan Syal,
Michael S. Hsiao:
Untestable Fault Identification using Recurrence Relations and Impossible Value Assignments.
VLSI Design 2004: 481-486 |
| 2003 |
|---|
| 2 | EE | Manan Syal,
Michael S. Hsiao:
A Novel, Low-Cost Algorithm for Sequentially Untestable Fault Identification.
DATE 2003: 10316-10321 |
| 1 | EE | Manan Syal,
Michael S. Hsiao,
Kiran B. Doreswamy,
Sreejit Chakravarty:
Efficient Implication - Based Untestable Bridge Fault Identifier.
VTS 2003: 393-402 |
