| 2008 |
|---|
| 8 | EE | Hyunjin Kim,
Hyejeong Hong,
Hong-Sik Kim,
Jin-Ho Ahn,
Sungho Kang:
Total Energy Minimization of Real-Time Tasks in an On-Chip Multiprocessor Using Dynamic Voltage Scaling Efficiency Metric.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 2088-2092 (2008) |
| 7 | EE | Hong-Sik Kim,
Sungho Kang,
Michael S. Hsiao:
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.
J. Electronic Testing 24(4): 365-378 (2008) |
| 2006 |
|---|
| 6 | EE | Hong-Sik Kim,
Sungho Kang:
Increasing encoding efficiency of LFSR reseeding-based test compression.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(5): 913-917 (2006) |
| 5 | EE | Sunghoon Chun,
Sangwook Kim,
Hong-Sik Kim,
Sungho Kang:
An Efficient Dictionary Organization for Maximum Diagnosis.
J. Electronic Testing 22(1): 37-48 (2006) |
| 2003 |
|---|
| 4 | EE | Hong-Sik Kim,
YongJoon Kim,
Sungho Kang:
Test-decompression mechanism using a variable-length multiple-polynomial LFSR.
IEEE Trans. VLSI Syst. 11(4): 687-690 (2003) |
| 2002 |
|---|
| 3 | EE | Hong-Sik Kim,
Sungho Kang:
DPSC SRAM Transparent Test Algorithm.
Asian Test Symposium 2002: 145-150 |
| 2001 |
|---|
| 2 | | Hong-Sik Kim,
Jin-kyue Lee,
Sungho Kang:
A Heuristic for Multiple Weight Set Generation.
ICCD 2001: 513-514 |
| 1 | | Hong-Sik Kim,
Jin-kyue Lee,
Sungho Kang:
A new multiple weight set calculation algorithm.
ITC 2001: 878-884 |
