Gurjeet S. Saund

1998
3	EE	Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel: Partial Scan Selection Based on Dynamic Reachability and Observability Information. VLSI Design 1998: 174-180
1997
2		Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel: Partial Scan beyond Cycle Cutting. FTCS 1997: 320-328
1995
1	EE	C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal: A STAFAN-like functional testability measure for register-level circuits. Asian Test Symposium 1995: 192-198

Coauthor Index

1	Nidhi Agrawal	[1]
2	Michael S. Hsiao	[2] [3]
3	Janak H. Patel	[2] [3]
4	C. P. Ravikumar	[1]
5	Elizabeth M. Rudnick	[3]

Colors in the list of coauthors