| 2007 |
|---|
| 11 | EE | Vishnu C. Vimjam,
Enamul Amyeen,
Ruifeng Guo,
Srikanth Venkataraman,
Michael S. Hsiao,
Kai Yang:
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology.
VTS 2007: 231-238 |
| 2006 |
|---|
| 10 | EE | Bharath Seshadri,
Irith Pomeranz,
Srikanth Venkataraman,
Enamul Amyeen,
Sudhakar M. Reddy:
Dominance Based Analysis for Large Volume Production Fail Diagnosis.
VTS 2006: 392-399 |
| 9 | EE | Ruifeng Guo,
Subhasish Mitra,
Enamul Amyeen,
Jinkyu Lee,
Srihari Sivaraj,
Srikanth Venkataraman:
Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive.
VTS 2006: 66-71 |
| 2004 |
|---|
| 8 | EE | Enamul Amyeen,
Srikanth Venkataraman,
Ajay Ojha,
Sangbong Lee:
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor.
ITC 2004: 669-678 |
| 7 | EE | Irith Pomeranz,
Srikanth Venkataraman,
Sudhakar M. Reddy,
Enamul Amyeen:
Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults.
VLSI Design 2004: 475-480 |
| 6 | EE | Srikanth Venkataraman,
Srihari Sivaraj,
Enamul Amyeen,
Sangbong Lee,
Ajay Ojha,
Ruifeng Guo:
An Experimental Study of N-Detect Scan ATPG Patterns on a Processor.
VTS 2004: 23-30 |
| 2003 |
|---|
| 5 | EE | Xiaoming Yu,
Enamul Amyeen,
Srikanth Venkataraman,
Ruifeng Guo,
Irith Pomeranz:
Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation.
VTS 2003: 351-358 |
| 4 | EE | Enamul Amyeen,
W. Kent Fuchs,
Irith Pomeranz,
Vamsi Boppana:
Fault equivalence identification in combinational circuits using implication and evaluation techniques.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(7): 922-936 (2003) |
| 2002 |
|---|
| 3 | EE | Enamul Amyeen,
Irith Pomeranz,
W. Kent Fuchs:
Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits.
VTS 2002: 181-186 |
| 2001 |
|---|
| 2 | EE | Enamul Amyeen,
W. Kent Fuchs,
Irith Pomeranz,
Vamsi Boppana:
Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction.
VTS 2001: 124-130 |
| 1999 |
|---|
| 1 | EE | Enamul Amyeen,
W. Kent Fuchs,
Irith Pomeranz,
Vamsi Boppana:
Implication and Evaluation Techniques for Proving Fault Equivalence.
VTS 1999: 201-213 |
