| 2003 |
|---|
| 6 | EE | Manan Syal,
Michael S. Hsiao,
Kiran B. Doreswamy,
Sreejit Chakravarty:
Efficient Implication - Based Untestable Bridge Fault Identifier.
VTS 2003: 393-402 |
| 2000 |
|---|
| 5 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Resource-Constrained Compaction of Sequential Circuit Test Sets.
VLSI Design 2000: 398-405 |
| 4 | EE | Surendra Bommu,
Kiran B. Doreswamy,
Srimat T. Chakradhar:
A Practical Vector Restoration Technique for Large Sequential Circuits.
J. Electronic Testing 16(5): 521-539 (2000) |
| 1998 |
|---|
| 3 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Vector Restoration Using Accelerated Validation and Refinement.
Asian Test Symposium 1998: 458-466 |
| 2 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Static compaction using overlapped restoration and segment pruning.
ICCAD 1998: 140-146 |
| 1 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Static test sequence compaction based on segment reordering and accelerated vector restoration.
ITC 1998: 954- |
