2008 |
33 | EE | Xin Li,
Daryl Shannon,
Indradeep Ghosh,
Mizuhito Ogawa,
Sreeranga P. Rajan,
Sarfraz Khurshid:
Context-Sensitive Relevancy Analysis for Efficient Symbolic Execution.
APLAS 2008: 36-52 |
2006 |
32 | EE | Indradeep Ghosh,
Mukul R. Prasad:
A Technique for Estimating the Difficulty of a Formal Verification Problem.
ISQED 2006: 63-70 |
31 | EE | Liang Zhang,
Indradeep Ghosh,
Michael S. Hsiao:
A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2526-2538 (2006) |
2005 |
30 | EE | Indradeep Ghosh:
High Level Test Generation for Custom Hardware: An Industrial Perspective.
Asian Test Symposium 2005: 458 |
2004 |
29 | EE | Indradeep Ghosh,
Rajarshi Mukherjee,
Mukul R. Prasad,
Masahiro Fujita:
High Level Design Validation: Current Practices and Future Directions.
VLSI Design 2004: 9-11 |
2003 |
28 | EE | Indradeep Ghosh,
Srivaths Ravi:
On automatic generation of RTL validation test benches using circuit testing techniques.
ACM Great Lakes Symposium on VLSI 2003: 289-294 |
27 | EE | Liang Zhang,
Michael S. Hsiao,
Indradeep Ghosh:
Automatic Design Validation Framework for HDL Descriptions via RTL ATPG.
Asian Test Symposium 2003: 148-153 |
26 | EE | Afshin Abdollahi,
Massoud Pedram,
Farzan Fallah,
Indradeep Ghosh:
Precomputation-based Guarding for Dynamic and Leakage Power Reduction.
ICCD 2003: 90-97 |
25 | EE | Liang Zhang,
Indradeep Ghosh,
Michael S. Hsiao:
Efficient Sequential ATPG for Functional RTL Circuits.
ITC 2003: 290-298 |
2002 |
24 | EE | Indradeep Ghosh,
Krishna Sekar,
Vamsi Boppana:
Design for Verification at the Register Transfer Level.
VLSI Design 2002: 420-425 |
2001 |
23 | EE | Srivaths Ravi,
Indradeep Ghosh,
Vamsi Boppana,
Niraj K. Jha:
Fault-diagnosis-based technique for establishing RTL and gate-levelcorrespondences.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(12): 1414-1425 (2001) |
22 | EE | Indradeep Ghosh,
Masahiro Fujita:
Automatic test pattern generation for functional register-transferlevel circuits using assignment decision diagrams.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(3): 402-415 (2001) |
2000 |
21 | EE | Indradeep Ghosh,
Masahiro Fujita:
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams.
DAC 2000: 43-48 |
20 | EE | Srivaths Ravi,
Niraj K. Jha,
Indradeep Ghosh,
Vamsi Boppana:
A Technique for Identifying RTL and Gate-Level Correspondences.
ICCD 2000: 591- |
19 | EE | Vamsi Boppana,
Indradeep Ghosh,
Rajarshi Mukherjee,
Jawahar Jain,
Masahiro Fujita:
Hierarchical Error Diagnosis Targeting RTL Circuits.
VLSI Design 2000: 436-441 |
18 | EE | Indradeep Ghosh,
Niraj K. Jha,
Sudipta Bhawmik:
A BIST scheme for RTL circuits based on symbolic testabilityanalysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 111-128 (2000) |
17 | EE | Indradeep Ghosh,
Sujit Dey,
Niraj K. Jha:
A fast and low-cost testing technique for core-based system-chips.
IEEE Trans. on CAD of Integrated Circuits and Systems 19(8): 863-877 (2000) |
1999 |
16 | EE | Indradeep Ghosh,
Niraj K. Jha,
Sujit Dey:
A low overhead design for testability and test generation technique for core-based systems-on-a-chip.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(11): 1661-1676 (1999) |
15 | EE | Indradeep Ghosh,
Anand Raghunathan,
Niraj K. Jha:
Hierarchical test generation and design for testability methods for ASPPs and ASIPs.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(3): 357-370 (1999) |
1998 |
14 | EE | Indradeep Ghosh,
Sujit Dey,
Niraj K. Jha:
A Fast and Low Cost Testing Technique for Core-Based System-on-Chip.
DAC 1998: 542-547 |
13 | EE | Indradeep Ghosh,
Niraj K. Jha,
Sudipta Bhawmik:
A BIST Scheme for RTL Controller-Data Paths Based on Symbolic Testability Analysis.
DAC 1998: 554-559 |
12 | EE | Srivaths Ravi,
Indradeep Ghosh,
Rabindra K. Roy,
Sujit Dey:
Controller Resynthesis for Testability Enhancement of RTL Controller/Data path Circuits.
VLSI Design 1998: 193-198 |
11 | EE | Indradeep Ghosh,
Anand Raghunathan,
Niraj K. Jha:
A design-for-testability technique for register-transfer level circuits using control/data flow extraction.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(8): 706-723 (1998) |
10 | EE | Indradeep Ghosh,
Niraj K. Jha:
High-level test synthesis: a survey.
Integration 26(1-2): 79-99 (1998) |
9 | EE | Srivaths Ravi,
Indradeep Ghosh,
Rabindra K. Roy,
Sujit Dey:
Controller Resynthesis for Testability Enhancement of RTL Controller/Data Path Circuits.
J. Electronic Testing 13(2): 201-212 (1998) |
1997 |
8 | EE | Indradeep Ghosh,
Anand Raghunathan,
Niraj K. Jha:
Hierarchical Test Generation and Design for Testability of ASPPs and ASIPs.
DAC 1997: 534-539 |
7 | | Indradeep Ghosh,
Niraj K. Jha,
Sujit Dey:
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems.
ITC 1997: 50-59 |
6 | EE | Sudipta Bhawmik,
Indradeep Ghosh:
A Practical Method for Selecting Partial Scan Flip-flops for Large Circuits.
VLSI Design 1997: 284-288 |
5 | EE | Indradeep Ghosh,
Anand Raghunathan,
Niraj K. Jha:
Design for hierarchical testability of RTL circuits obtained by behavioral synthesis.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(9): 1001-1014 (1997) |
1996 |
4 | EE | Indradeep Ghosh,
Anand Raghunathan,
Niraj K. Jha:
A design for testability technique for RTL circuits using control/data flow extraction.
ICCAD 1996: 329-336 |
1995 |
3 | EE | Indradeep Ghosh,
Anand Raghunathan,
Niraj K. Jha:
Design for hierarchical testability of RTL circuits obtained by behavioral synthesis.
ICCD 1995: 173-179 |
2 | | Indradeep Ghosh,
Bandana Majumdar:
VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images.
IJPRAI 9(2): 449-462 (1995) |
1994 |
1 | | Indradeep Ghosh,
Bandana Majumdar:
Design of an Application Specific VLSI Chip for Image Rotation.
VLSI Design 1994: 275-278 |