2002 | ||
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3 | EE | Sandhya Seshadri, Michael S. Hsiao: Behavioral-Level DFT via Formal Operator Testability Measures. J. Electronic Testing 18(6): 595-611 (2002) |
2000 | ||
2 | EE | Sandhya Seshadri, Michael S. Hsiao: Formal Value-Range and Variable Testability Techniques for High-Level Design-For-Testability. J. Electronic Testing 16(1-2): 131-145 (2000) |
1999 | ||
1 | Sandhya Seshadri, Michael S. Hsiao: An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques. ITC 1999: 858-867 |
1 | Michael S. Hsiao | [1] [2] [3] |