ICCD 1993:
Cambridge,
MA,
USA
Proceedings 1993 International Conference on Computer Design:
VLSI in Computers & Processors,
ICCD '93,
Cambridge,
MA,
USA,
October 3-6,
1993. IEEE Computer Society Press,
1993,
ISBN 0-8186-4230-0
Concurrent Plenary Sessions 1.2.1
CAD Plenary
Concurrent Plenary Sessions 1.2.2
Embedded Systems Plenary
Design and Test Plenary
Concurrent Sessions 1.3
Estimation Techniques for Global Optimization in High-Level Synthesis
Cache Architectures
Design Verification and Modification
Concurrent Sessions 1.4
Timing Anlaysis and Optimization
High Performance General Purpose Machines
Embedded System Architectures
- Raymond Roth, John Watkins, Michael Hsieh, William Radke, Donald Hejna, Richard Tom, Byung Kim:
An Integrated Environment for Concurrent Development of a Pixel Processor ASIC and Application Software.
116-125 BibTeX
- Ulrich Holtmann, Rolf Ernst:
Speculative Computation for Coprocessor Synthesis.
126-131 BibTeX
- J. Morris Chang, Edward F. Gehringer:
Evaluation of an Object-Caching Coprocessor Design for Object-Oriented Systems.
132-139 BibTeX
- Wayne Burleson, Jason Ko, Douglas Niehaus, Krithi Ramamritham, John A. Stankovic, Gary Wallace, Charles C. Weems:
The Spring Scheduling Co-Processor: A Scheduling Accelerator.
140-144 BibTeX
Scan Design
Concurrent Sessions 2.1
Asynchronous Design
Desgin Concepts
Multipliers/Dividers
Programmable Gate Array Architectures and Systems
Concurrent Sessions 2.2
Formal Methods I
Microprocessor Design
Computer Arithmetic
VLSI Systems
Concurrent Sessions 2.3
Binary Decision Diagrams
Test Generation and Evaluation
Memory Systems
Analysis and Simulation
Concurrent Sessions 2.4
Scheduling Techniques in High-Level Synthesis
Economics of Design and Test
Fine Grain Parallelism
Combinatorial Logic Optimization
Concurrent Sessions 3.1
Formal Methods II
Partitioning and Analysis
Methods and Limitations in CAD Layout
FPGAs for Custom Computing Machines
Concurrent Sessions 3.2
Logic Synthesis
Design for Testability
Reliability Issues
High Level Tools
Concurrent Sessions 3.3
Fault Simulation
Fault Tolerance and Reliability
Signal Processing
Copyright © Sat May 16 23:16:39 2009
by Michael Ley (ley@uni-trier.de)