| 2008 |
|---|
| 11 | EE | Nilabha Dev,
Sandeep Bhatia,
Subhasish Mukherjee,
Sue Genova,
Vinayak Kadam:
A Partitioning Based Physical Scan Chain Allocation Algorithm that Minimizes Voltage Domain Crossings.
VLSI Design 2008: 187-193 |
| 2003 |
|---|
| 10 | EE | Sandeep Bhatia:
Test Compaction by Using Linear-Matrix Driven Scan Chains.
DFT 2003: 185-190 |
| 1998 |
|---|
| 9 | EE | Prab Varma,
Sandeep Bhatia:
A structured test re-use methodology for core-based system chips.
ITC 1998: 294-302 |
| 8 | EE | Sandeep Bhatia,
Niraj K. Jha:
Integration of hierarchical test generation with behavioral synthesis of controller and data path circuits.
IEEE Trans. VLSI Syst. 6(4): 608-619 (1998) |
| 1997 |
|---|
| 7 | EE | Sandeep Bhatia,
Prab Varma:
Test Compaction in a Parallel Access Scan Environment.
Asian Test Symposium 1997: 300-305 |
| 1996 |
|---|
| 6 | | Sandeep Bhatia,
Tushar Gheewala,
Prab Varma:
A Unifying Methodology for Intellectual Property and Custom Logic Testing.
ITC 1996: 639-648 |
| 5 | EE | Sandeep Bhatia,
Niraj K. Jha:
Synthesis for parallel scan: applications to partial scan and robust path-delay fault testability.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(2): 228-243 (1996) |
| 1994 |
|---|
| 4 | | Sandeep Bhatia,
Niraj K. Jha:
Genesis: A Behavioral Synthesis System for Hierarchical Testability.
EDAC-ETC-EUROASIC 1994: 272-276 |
| 3 | | Sandeep Bhatia,
Niraj K. Jha:
Behavioral Synthesis for Hierarchical Testability of Controller/Data Path Circuits with Conditional Branches.
ICCD 1994: 91-96 |
| 1993 |
|---|
| 2 | | Sandeep Bhatia,
Niraj K. Jha:
Synthesis of Sequential Circuits for Easy Testability Through Performance-Oriented Parallel Partial Scan.
ICCD 1993: 151-154 |
| 1 | | Sandeep Bhatia,
Niraj K. Jha:
Synthesis of Sequential Circuits for Robust Path Delay Fault Testability.
VLSI Design 1993: 275-280 |
