| 1994 |
|---|
| 6 | EE | I. D. Dear,
Chryssa Dislis,
Anthony P. Ambler,
J. Dick:
Test strategy planning using economic analysis.
J. Electronic Testing 5(2-3): 137-155 (1994) |
| 1993 |
|---|
| 5 | | Chryssa Dislis,
Anthony P. Ambler,
I. D. Dear,
J. H. Dick:
Economics in Design and Test.
ICCD 1993: 384-387 |
| 4 | | Chryssa Dislis,
J. H. Dick,
I. D. Dear,
I. N. Azu,
Anthony P. Ambler:
Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards.
ITC 1993: 210-217 |
| 1991 |
|---|
| 3 | EE | I. D. Dear,
Chryssa Dislis,
Anthony P. Ambler,
J. H. Dick:
Economic Effects in Design and Test.
IEEE Design & Test of Computers 8(4): 64-77 (1991) |
| 1989 |
|---|
| 2 | | Chryssa Dislis,
I. D. Dear,
J. R. Miles,
S. C. Lau,
Anthony P. Ambler:
Cost Analysis of Test Method Environments.
ITC 1989: 875-883 |
| 1986 |
|---|
| 1 | | Mark Paraskeva,
Anthony P. Ambler,
D. F. Burrows,
W. L. Knight,
I. D. Dear:
Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI.
ITC 1986: 232-243 |
