Anthony P. Ambler

2006
20	EE	Taikyeong T. Jeong, Anthony P. Ambler: Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. ICCSA (5) 2006: 531-536
2005
19	EE	Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler: Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. ISVLSI 2005: 194-199
18	EE	Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler: Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. ISVLSI 2005: 255-256
2002
17	EE	Anthony P. Ambler: Is It Rocket Science? ITC 2002: 1188-1189
16	EE	David Williams, Anthony P. Ambler: System Manufacturing Test Cost Model. ITC 2002: 482-490
2001
15	EE	Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman: From DFT to systems test - a model based cost optimization tool. DATE 2001: 302-306
2000
14		Anthony P. Ambler, Seraphin B. Calo, Gautam Kar: Services Management in Intelligent Networks, 11th IFIP/IEEE International Workshop on Distributed Systems: Operations and Management, DSOM 2000, Aaustin, Texas, USA, December 4-6, 2000, Proceedings Springer 2000
1997
13	EE	Des Farren, Anthony P. Ambler: The Economics of System-Level Testing. IEEE Design & Test of Computers 14(3): 51-58 (1997)
1995
12		Des Farren, Anthony P. Ambler: Cost-Effective System-Level Test Strategies. ITC 1995: 807-813
1994
11		Des Farren, Anthony P. Ambler: System Test Cost Modelling Based on Event Rate Analysis. ITC 1994: 84-92
10	EE	I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. Dick: Test strategy planning using economic analysis. J. Electronic Testing 5(2-3): 137-155 (1994)
9	EE	J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler: Sensitivity analysis in economics based test strategy planning. J. Electronic Testing 5(2-3): 239-251 (1994)
1993
8		Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick: Economics in Design and Test. ICCD 1993: 384-387
7		Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler: Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC 1993: 210-217
6		Chryssa Dislis, J. H. Dick, Anthony P. Ambler: Algorithms for Cost Optimised Test Strategy Selection. ITC 1993: 383-391
1992
5		Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler: A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. ITC 1992: 415-421
1991
4	EE	I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick: Economic Effects in Design and Test. IEEE Design & Test of Computers 8(4): 64-77 (1991)
1989
3		Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler: Cost Analysis of Test Method Environments. ITC 1989: 875-883
1986
2		Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear: Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243
1984
1		Prab Varma, Anthony P. Ambler, Keith Baker: An Analysis of the Economics of Self Test. ITC 1984: 20-30

Coauthor Index

1	Alaa F. Alani	[5]
2	I. N. Azu	[7]
3	Keith Baker	[1]
4	D. F. Burrows	[2]
5	Seraphin B. Calo	[14]
6	I. D. Dear	[2] [3] [4] [7] [8] [10]
7	J. Dick	[10]
8	J. H. Dick	[4] [6] [7] [8] [9]
9	Chryssa Dislis	[3] [4] [6] [7] [8] [9] [10]
10	Des Farren	[11] [12] [13]
11	Jae-Hoon Jeong	[19]
12	Taikyeong T. Jeong (Taikyeong Jeong)	[20]
13	Gautam Kar	[14]
14	W. L. Knight	[2]
15	S. C. Lau	[3]
16	Il-soo Lee	[18] [19]
17	Yu-Ting Lin	[18]
18	Christoph Maaß	[15]
19	J. R. Miles	[3]
20	Gerry Musgrave	[5]
21	Mark Paraskeva	[2]
22	Mohammed Rahman	[15]
23	Erwin Trischler	[9]
24	Prab Varma	[1]
25	Michael G. Wahl	[15]
26	David Williams	[16]

Colors in the list of coauthors