| 1999 |
|---|
| 15 | EE | Stephen K. Sunter,
Naveena Nagi:
Test Metrics for Analog Parametric Faults.
VTS 1999: 226-235 |
| 1998 |
|---|
| 14 | EE | Heebyung Yoon,
Pramodchandran N. Variyam,
Abhijit Chatterjee,
Naveena Nagi:
Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits.
VTS 1998: 145-151 |
| 13 | EE | Naveena Nagi,
Abhijit Chatterjee,
Heebyung Yoon,
Jacob A. Abraham:
Signature analysis for analog and mixed-signal circuit test response compaction.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(6): 540-546 (1998) |
| 1997 |
|---|
| 12 | | Stephen K. Sunter,
Naveena Nagi:
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST.
ITC 1997: 389-395 |
| 11 | EE | Abhijit Chatterjee,
Naveena Nagi:
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial.
VLSI Design 1997: 388-392 |
| 10 | EE | Pramodchandran N. Variyam,
Abhijit Chatterjee,
Naveena Nagi:
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling.
VTS 1997: 261-266 |
| 1996 |
|---|
| 9 | EE | Abhijit Chatterjee,
Bruce C. Kim,
Naveena Nagi:
Low-cost DC built-in self-test of linear analog circuits using checksums.
VLSI Design 1996: 230-233 |
| 8 | EE | Abhijit Chatterjee,
Bruce C. Kim,
Naveena Nagi:
DC Built-In Self-Test for Linear Analog Circuits.
IEEE Design & Test of Computers 13(2): 26-33 (1996) |
| 7 | EE | Ashok Balivada,
Hong Zheng,
Naveena Nagi,
Abhijit Chatterjee,
Jacob A. Abraham:
A unified approach for fault simulation of linear mixed-signal circuits.
J. Electronic Testing 9(1-2): 29-41 (1996) |
| 1995 |
|---|
| 6 | EE | Naveena Nagi,
Abhijit Chatterjee,
Ashok Balivada,
Jacob A. Abraham:
Efficient multisine testing of analog circuits.
VLSI Design 1995: 234-238 |
| 1994 |
|---|
| 5 | | Naveena Nagi,
Abhijit Chatterjee,
Jacob A. Abraham:
A Signature Analyzer for Analog and Mixed-signal Circuits.
ICCD 1994: 284-287 |
| 1993 |
|---|
| 4 | EE | Naveena Nagi,
Abhijit Chatterjee,
Jacob A. Abraham:
DRAFTS: Discretized Analog Circuit Fault Simulator.
DAC 1993: 509-514 |
| 3 | EE | Naveena Nagi,
Abhijit Chatterjee,
Ashok Balivada,
Jacob A. Abraham:
Fault-based automatic test generator for linear analog circuits.
ICCAD 1993: 88-91 |
| 2 | | Naveena Nagi,
Abhijit Chatterjee,
Jacob A. Abraham:
MIXER: Mixed-Signal Fault Simulator.
ICCD 1993: 568-571 |
| 1 | EE | Naveena Nagi,
Abhijit Chatterjee,
Jacob A. Abraham:
Fault simulation of linear analog circuits.
J. Electronic Testing 4(4): 345-360 (1993) |
