Chryssa Dislis

2002
14	EE	Chryssa Dislis: Improving Service Availability via Low-Outage Upgrades. COMPSAC 2002: 989-993
2001
13	EE	Deirdre Donovan, Chryssa Dislis, Ray Murphy, Stephen Unger, Christina Kenneally, Janet Young, Liz Sheehan: Incorporating Software Reliability Engineering into the Test Process for an Extensive GUI-Based Network Management System. ISSRE 2001: 44-53
1999
12		Norma Barrett, Simon Martin, Chryssa Dislis: Test process optimization: closing the gap in the defect spectrum. ITC 1999: 124-129
11		Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren: The evolution of a system test process [for Motorola GSM products]. ITC 1999: 680-688
1998
10	EE	Chryssa Dislis, Gerry Musgrave, Roger B. Hughes: Formal Design Techniques - Theory and Engineering Reality. Asian Test Symposium 1998: 394-398
9		David E. Schimmel, Chryssa Dislis: Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems. IEEE Design & Test of Computers 15(3): 8-9 (1998)
1995
8		Chryssa Dislis, A. F. Al-Ani, Ian P. Jalowiecki: MCM Quality and Cost Analysis Using Economics Models. ITC 1995: 430-437
1994
7	EE	I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. Dick: Test strategy planning using economic analysis. J. Electronic Testing 5(2-3): 137-155 (1994)
6	EE	J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler: Sensitivity analysis in economics based test strategy planning. J. Electronic Testing 5(2-3): 239-251 (1994)
1993
5		Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick: Economics in Design and Test. ICCD 1993: 384-387
4		Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler: Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC 1993: 210-217
3		Chryssa Dislis, J. H. Dick, Anthony P. Ambler: Algorithms for Cost Optimised Test Strategy Selection. ITC 1993: 383-391
1991
2	EE	I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick: Economic Effects in Design and Test. IEEE Design & Test of Computers 8(4): 64-77 (1991)
1989
1		Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler: Cost Analysis of Test Method Environments. ITC 1989: 875-883

Coauthor Index

1	A. F. Al-Ani	[8]
2	Anthony P. Ambler	[1] [2] [3] [4] [5] [6] [7]
3	I. N. Azu	[4]
4	Norma Barrett	[12]
5	Robert Bleck	[11]
6	I. D. Dear	[1] [2] [4] [5] [7]
7	J. Dick	[7]
8	J. H. Dick	[2] [3] [4] [5] [6]
9	Deirdre Donovan	[13]
10	Des Farren	[11]
11	Roger B. Hughes	[10]
12	Ian P. Jalowiecki	[8]
13	Christina Kenneally	[13]
14	S. C. Lau	[1]
15	Simon Martin	[11] [12]
16	J. R. Miles	[1]
17	Ray Murphy	[13]
18	Gerry Musgrave	[10]
19	David E. Schimmel	[9]
20	Liz Sheehan	[13]
21	Erwin Trischler	[6]
22	Stephen Unger	[13]
23	Janet Young	[13]

Colors in the list of coauthors