13. IOLTS 2007:
Heraklion,
Crete,
Greece
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 8-11 July 2007, Heraklion, Crete, Greece.
IEEE Computer Society 2007 BibTeX
Test Technology Educational Program (TTEP) 2007 Full-Day Tutorial
Keynote Talk
Invited Talk
Session 1:
Reliability Issues in Nanometer Technologies
- Jaume Abella, Xavier Vera, Osman S. Unsal, Oguz Ergin, Antonio González:
Fuse: A Technique to Anticipate Failures due to Degradation in ALUs.
15-22
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- Ming Zhang, T. M. Mak, James Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu:
Design for Resilience to Soft Errors and Variations.
23-28
Electronic Edition (link) BibTeX
- Somnath Paul, Rajat Subhra Chakraborty, Swarup Bhunia:
Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield.
29-36
Electronic Edition (link) BibTeX
Session 2:
Network-on-Chip Reliability and Fault Tolerance
Session 3:
Secure Systems
Session 4:
Large Scale Dependability
Session 5:
Dependability of Processors,
SoCs and Asynchronous Circuits
Special Session 1:
Aging and Wearout Issues and Mitigation Approaches
Keynote Talk
Session 6:
Radiation Effects
- Tino Heijmen:
Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs.
131-136
Electronic Edition (link) BibTeX
- Claudia Rusu, A. Bougerol, Lorena Anghel, C. Weulersse, N. Buard, S. Benhammadi, N. Renaud, G. Hubert, F. Wrobel, T. Carriere, R. Gaillard:
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.
137-145
Electronic Edition (link) BibTeX
- M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions.
146-151
Electronic Edition (link) BibTeX
- Alodeep Sanyal, Sandip Kundu:
On Derating Soft Error Probability Based on Strength Filtering.
152-160
Electronic Edition (link) BibTeX
Session 7:
Signal Integrity and Error Compensation
- Partha Pratim Pande, Amlan Ganguly, Brett Feero, Cristian Grecu:
Applicability of Energy Efficient Coding Methodology to Address Signal Integrity in 3D NoC Fabrics.
161-166
Electronic Edition (link) BibTeX
- Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits.
167-172
Electronic Edition (link) BibTeX
- Muhammad Mudassar Nisar, Maryam Ashouei, Abhijit Chatterjee:
Probabilistic Concurrent Error Compensation in Nonlinear Digital Filters Using Linearized Checksums.
173-182
Electronic Edition (link) BibTeX
Special Session 2:
Panel:
SER Trends in 45nm and Beyond
Session 8:
Posters
- X. Cano, Sebastià A. Bota, R. Graciani, D. Gascón, A. Herms, A. Comerma, Jaume Segura, L. Garrido:
Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment.
183-184
Electronic Edition (link) BibTeX
- Olivier Faurax, Assia Tria, Laurent Freund, Frédéric Bancel:
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool.
185-186
Electronic Edition (link) BibTeX
- Riccardo Mariani, Gabriele Boschi:
A systematic approach for Failure Modes and Effects Analysis of System-On-Chips.
187-188
Electronic Edition (link) BibTeX
- Costas Argyrides, Dhiraj K. Pradhan:
Highly Reliable Power Aware Memory Design.
189-190
Electronic Edition (link) BibTeX
- Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
Accelerating Soft Error Rate Testing Through Pattern Selection.
191-193
Electronic Edition (link) BibTeX
- Salvatore Pontarelli, Luca Sterpone, Gian-Carlo Cardarilli, Marco Re, Matteo Sonza Reorda, Adelio Salsano, Massimo Violante:
Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon Decoders.
194-196
Electronic Edition (link) BibTeX
- Ioannis Voyiatzis:
Embedding test patterns into Low-Power BIST sequences.
197-198
Electronic Edition (link) BibTeX
- Fabrice Monteiro, Stanislaw J. Piestrak, Houssein Jaber, Abbas Dandache:
Fault-Secure Interface Between Fault-Tolerant RAM and Transmission Channel Using Systematic Cyclic Codes.
199-200
Electronic Edition (link) BibTeX
- Ilia Polian, Damian Nowroth, Bernd Becker:
Identification of Critical Errors in Imaging Applications.
201-202
Electronic Edition (link) BibTeX
- Franz X. Ruckerbauer, Georg Georgakos:
Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena.
203-204
Electronic Edition (link) BibTeX
- Mohammad Hosseinabady, Mohammad Hossein Neishaburi, Zainalabedin Navabi, Alfredo Benso, Stefano Di Carlo, Paolo Prinetto, Giorgio Di Natale:
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC.
205-206
Electronic Edition (link) BibTeX
- Jimson Mathew, Hafizur Rahaman, Dhiraj K. Pradhan:
Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test set.
207-208
Electronic Edition (link) BibTeX
Session 9:
Fault Tolerance
Session 10:
On-Line Testing for Analog,
Mixed-Signal,
RF and Delay Defect Tolerance
Special Session 3:
Fault-Tolerant and Self-Adapting Design to Mitigate Power,
Yield and Reliability Issues in Upcoming Process Nodes
Special Session 4:
Reconfiguration and Fault Tolerance in Future Massively Parallel Multi-Core Chips
Session 11:
Processor-Based Testing
- Leticia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero:
An Automated Methodology for Cogeneration of Test Blocks for Peripheral Cores.
265-270
Electronic Edition (link) BibTeX
- A. Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis:
A Functional Self-Test Approach for Peripheral Cores in Processor-Based SoCs.
271-276
Electronic Edition (link) BibTeX
- R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus:
A Configurable Modular Test Processor and Scan Controller Architecture.
277-284
Electronic Edition (link) BibTeX
- Steffen Tarnick:
Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters.
285-292
Electronic Edition (link) BibTeX
- Snehal Udar, Dimitri Kagaris:
LFSR Reseeding with Irreducible Polynomials.
293-298
Electronic Edition (link) BibTeX
Copyright © Sat May 16 23:24:14 2009
by Michael Ley (ley@uni-trier.de)
