Salvador Mir

2009
39	EE	Haralampos-G. D. Stratigopoulos, Salvador Mir, Ahcène Bounceur: Evaluation of Analog/RF Test Measurements at the Design Stage. IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 582-590 (2009)
2008
38	EE	Haralampos-G. D. Stratigopoulos, Jeanne Tongbong, Salvador Mir: A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation. DATE 2008: 68-73
2007
37	EE	Jeanne Tongbong, Salvador Mir, Jean-Louis Carbonéro: Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model. DATE 2007: 731-736
36	EE	Emmanuel Simeu, Salvador Mir, R. Kherreddine, H. N. Nguyen: Envelope Detection Based Transition Time Supervision for Online Testing of RF MEMS Switches. IOLTS 2007: 237-243
35	EE	Ahcène Bounceur, Salvador Mir, Emmanuel Simeu, Luís Rolíndez: Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. J. Electronic Testing 23(6): 471-484 (2007)
2006
34	EE	Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: Pseudorandom functional BIST for linear and nonlinear MEMS. DATE 2006: 664-669
33	EE	Ahcène Bounceur, Salvador Mir, Luís Rolíndez, Emmanuel Simeu: CAT platform for analogue and mixed-signal test evaluation and optimization. VLSI-SoC 2006: 320-325
32	EE	Livier Lizzarraga, Salvador Mir, Gilles Sicard, Ahcène Bounceur: Study of a BIST Technique for CMOS Active Pixel Sensors. VLSI-SoC 2006: 326-331
31	EE	Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319
30	EE	Salvador Mir, Tim Cheng, Andrew Richardson: Guest Editorial. J. Electronic Testing 22(4-6): 311 (2006)
29	EE	Luís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing 22(4-6): 325-335 (2006)
28	EE	Salvador Mir, Libor Rufer, Achraf Dhayni: Built-in-self-test techniques for MEMS. Microelectronics Journal 37(12): 1591-1597 (2006)
2005
27	EE	Rabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir: Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. DATE 2005: 170-171
26	EE	Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: On-chip Pseudorandom Testing for Linear and Nonlinear MEMS. VLSI-SoC 2005: 245-266
25	EE	Libor Rufer, Salvador Mir, Emmanuel Simeu, C. Domingues: On-Chip Pseudorandom MEMS Testing. J. Electronic Testing 21(3): 233-241 (2005)
24	EE	Bozena Kaminska, Stephen K. Sunter, Salvador Mir: Analog and mixed signal test techniques for SOC development. Microelectronics Journal 36(12): 1063 (2005)
23	EE	Guillaume Prenat, Salvador Mir, Diego Vázquez, Luís Rolíndez: A low-cost digital frequency testing approach for mixed-signal devices using SigmaDelta modulation. Microelectronics Journal 36(12): 1080-1090 (2005)
2004
22	EE	Luís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène Bounceur: A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns. DATE 2004: 706-707
21	EE	Salvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-
2003
20	EE	Mohammad A. Naal, Emmanuel Simeu, Salvador Mir: On-Line Testable Decimation Filter Design for AMS Systems. IOLTS 2003: 83-88
19	EE	C. Roman, Salvador Mir, Benoît Charlot: Building an analogue fault simulation tool and its application to MEMS. Microelectronics Journal 34(10): 897-906 (2003)
2002
18	EE	Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim: SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450
2001
17	EE	Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217
16	EE	Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing 17(6): 459-470 (2001)
2000
15	EE	Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
14	EE	Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
13	EE	Salvador Mir, Benoît Charlot, Bernard Courtois: Extending Fault-Based Testing to Microelectromechanical Systems. J. Electronic Testing 16(3): 279-288 (2000)
1999
12		Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
11		Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
10	EE	Salvador Mir, Benoît Charlot: On the Integration of Design and Test for Chips Embedding MEMS. IEEE Design & Test of Computers 16(4): 28-38 (1999)
1998
9	EE	Salvador Mir, Adoración Rueda, Diego Vázquez, José Luis Huertas: Switch-Level Fault Coverage Analysis for Switched-Capacitor Systems. DATE 1998: 810-814
8	EE	A. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550
1997
7	EE	Salvador Mir, Adoración Rueda, Thomas Olbrich, Eduardo J. Peralías, José Luis Huertas: SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems. DAC 1997: 281-286
1996
6	EE	Marcelo Lubaszewski, Salvador Mir, Leandro Pulz: ABILBO: Analog BuILt-in Block Observer. ICCAD 1996: 600-603
5	EE	Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996)
4	EE	Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996)
1995
3	EE	Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
1994
2	EE	Salvador Mir, Nick Filer: Re-engineering hardware specifications by exploiting design semantics. EURO-DAC 1994: 336-341
1	EE	Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490

Coauthor Index

1	H. Bederr	[18]
2	R. D. (Shawn) Blanton (Ronald D. Blanton)	[18]
3	Ahcène Bounceur	[22] [26] [29] [31] [32] [33] [34] [35] [39]
4	Jean-Louis Carbonéro	[27] [29] [31] [37]
5	A. Castillejo	[8]
6	Benoît Charlot	[10] [12] [13] [15] [16] [17] [19]
7	Tim Cheng	[30]
8	Philippe Coste	[15]
9	Érika F. Cota	[12]
10	Bernard Courtois	[1] [3] [4] [5] [8] [11] [12] [13] [14] [15] [16] [17] [21]
11	V. Danelon	[27]
12	Achraf Dhayni	[26] [28] [34]
13	C. Domingues	[25]
14	Nick Filer	[2]
15	Manfred Glesner	[11]
16	Klaus Hofmann	[11]
17	José Luis Huertas (José L. Huertas)	[7] [9]
18	Ahmed Amine Jerraya	[15]
19	Bozena Kaminska	[24]
20	Jean-Michel Karam	[8] [11]
21	Hans G. Kerkhoff	[18]
22	Rabeb Kheriji	[27]
23	R. Kherreddine	[36]
24	H. J. Klim	[18]
25	Vladimir Kolarik	[1] [3] [14]
26	Livier Lizzarraga	[32]
27	Marcelo Lubaszewski	[1] [3] [4] [5] [6] [11] [12] [14]
28	Mohammad A. Naal	[20]
29	H. N. Nguyen	[36]
30	Gabriela Nicolescu	[15]
31	C. Nielsen	[1] [14]
32	Thomas Olbrich	[7]
33	Fabien Parrain	[15] [16] [17]
34	Eduardo J. Peralías	[7]
35	Guillaume Prenat	[22] [23]
36	Leandro Pulz	[6]
37	Márta Rencz	[11] [15]
38	Andrew Richardson	[30]
39	Luís Rolíndez	[22] [23] [29] [31] [33] [35]
40	C. Roman	[19]
41	Adoración Rueda	[7] [9]
42	Libor Rufer	[21] [25] [26] [28] [34]
43	Gilles Sicard	[32]
44	Emmanuel Simeu	[20] [25] [33] [35] [36]
45	Haralampos-G. D. Stratigopoulos	[38] [39]
46	Stephen K. Sunter	[24]
47	Vladimir Székely	[11]
48	Jeanne Tongbong	[37] [38]
49	Diego Vázquez	[9] [23]
50	D. Veychard	[8]
51	Nacer-Eddine Zergainoh	[15]

Colors in the list of coauthors