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2007 | ||
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1 | EE | R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus: A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284 |
1 | R. Frost Brandenburg | [1] |
2 | Christian Galke | [1] |
3 | René Kothe | [1] |
4 | Heinrich Theodor Vierhaus | [1] |