| |
| 2007 | ||
|---|---|---|
| 1 | EE | R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus: A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284 |
| 1 | R. Frost Brandenburg | [1] |
| 2 | Christian Galke | [1] |
| 3 | René Kothe | [1] |
| 4 | Heinrich Theodor Vierhaus | [1] |