| 2007 |
|---|
| 4 | EE | Claudia Rusu,
A. Bougerol,
Lorena Anghel,
C. Weulersse,
N. Buard,
S. Benhammadi,
N. Renaud,
G. Hubert,
F. Wrobel,
T. Carriere,
R. Gaillard:
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.
IOLTS 2007: 137-145 |
| 2006 |
|---|
| 3 | EE | G. Hubert,
A. Bougerol,
F. Miller,
N. Buard,
Lorena Anghel,
T. Carriere,
F. Wrobel,
R. Gaillard:
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.
IOLTS 2006: 63-74 |
| 2005 |
|---|
| 2 | EE | G. Hubert,
N. Buard,
C. Weulersse,
T. Carriere,
M.-C. Palau,
J.-M. Palau,
D. Lambert,
J. Baggio,
F. Wrobel,
F. Saigne,
R. Gaillard:
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.
IOLTS 2005: 87-94 |
| 2003 |
|---|
| 1 | EE | F. Darracq,
Hervé Lapuyade,
N. Buard,
P. Fouillat,
R. Dufayel,
T. Carriere:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.
Microelectronics Reliability 43(9-11): 1615-1619 (2003) |
