Alessandro Paccagnella

2007
10	EE	Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante: Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. DFT 2007: 79-86
9	EE	M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone: Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151
2006
8	EE	G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi: Erratic Effects of Irradiation in Floating Gate Memory Cells. IOLTS 2006: 51-56
7	EE	Simone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini: Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectronics Reliability 46(9-11): 1669-1672 (2006)
6	EE	Francesca Danesin, F. Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella: Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability 46(9-11): 1750-1753 (2006)
2005
5	EE	G. Cellere, Alessandro Paccagnella, A. Visconti, M. Bonanomi: Soft Errors induced by single heavy ions in Floating Gate memory arrays. DFT 2005: 275-284
4	EE	Monica Alderighi, A. Candelori, Fabio Casini, Sergio D'Angelo, Marcello Mancini, Alessandro Paccagnella, Sandro Pastore, Giacomo R. Sechi: Heavy Ion Effects on Configuration Logic of Virtex FPGAs. IOLTS 2005: 49-53
2004
3	EE	M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, Alessandro Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin: Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. DATE 2004: 584-589
2003
2	EE	Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori: Analyzing SEU Effects in SRAM-based FPGAs. IOLTS 2003: 119-123
1	EE	S. Cimino, A. Cester, Alessandro Paccagnella, G. Ghidini: Ionising radiation effects on MOSFET drain current. Microelectronics Reliability 43(8): 1247-1251 (2003)

Coauthor Index

1	Monica Alderighi	[4]
2	M. Bagatin	[9]
3	M. Bellato	[2] [3]
4	S. Beltrami	[9]
5	Paolo Bernardi	[2] [3]
6	M. Bonanomi	[5] [8]
7	D. Bortolato	[2] [3]
8	A. Candelori	[2] [3] [4]
9	Fabio Casini	[4]
10	G. Cellere	[5] [8] [9]
11	M. Ceschia	[2] [3]
12	A. Cester	[1] [7]
13	S. Cimino	[1]
14	Sergio D'Angelo	[4]
15	Francesca Danesin	[6]
16	Simone Gerardin	[6] [7] [9] [10]
17	G. Ghidini	[1] [7]
18	A. Griffoni	[7]
19	M. Maccarrone	[9]
20	Marcello Mancini	[4]
21	Andrea Manuzzato	[10]
22	Gaudenzio Meneghesso	[6]
23	Sandro Pastore	[4]
24	F. Rampazzo	[6]
25	Maurizio Rebaudengo	[2] [3]
26	Paolo Rech	[10]
27	Matteo Sonza Reorda	[2] [3]
28	Giacomo R. Sechi	[4]
29	Luca Sterpone	[10]
30	Massimo Violante	[2] [3] [10]
31	A. Visconti	[5] [8] [9]
32	P. Zambolin	[2] [3]
33	F. Zanon	[6]
34	Enrico Zanoni	[6]