Isabel C. Teixeira

2008
38	EE	Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37
2007
37		Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300
36	EE	Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311
35	EE	Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172
34	EE	Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212
2006
33		F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS 2006: 279-284
32	EE	M. Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262
2005
31		C. Leong, P. Bento, P. Rodrigues, A. Trindade, J. C. Silva, P. Lousã, J. Rego, J. Nobre, J. Varela, João Paulo Teixeira, Isabel C. Teixeira: Design and Test Methodology for a Reconfigurable PEM Data Acquisition Electronics System. FPL 2005: 523-526
30	EE	M. Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS 2005: 281-286
29	EE	D. Barros Júnior, M. Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electronic Testing 21(4): 349-363 (2005)
2004
28	EE	Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS 2004: 5-10
27	EE	Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, L. Balado, Joan Figueras: On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electronic Testing 20(4): 345-355 (2004)
2003
26	EE	Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira: RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE 2003: 10994-10999
25	EE	Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS 2003: 164-165
2002
24	EE	Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT 2002: 216-224
23	EE	Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras: RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC 2002: 814-823
22	EE	Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electronic Testing 18(2): 179-187 (2002)
21	EE	Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electronic Testing 18(3): 285-294 (2002)
2001
20	EE	Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher: Embedded tutorial: TRP: integrating embedded test and ATE. DATE 2001: 34-37
19		Hugo Lérias, João Luz, Pedro Moura, Ana Mendes, Isabel C. Teixeira, João Paulo Teixeira: Towards E-Management as Enabler for Accelerated Change. ICEIS (2) 2001: 807-814
18	EE	Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW 2001: 197-201
17		Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC 2001: 377-385
16	EE	Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electronic Testing 17(3-4): 311-319 (2001)
2000
15		Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Leandro Buss Becker, Carlos Eduardo Pereira: Optimizing Functional distribution in Complex System Design. DIPES 2000: 75-86
14	EE	Leandro Buss Becker, Carlos Eduardo Pereira, Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: MOSYS A Methodology for Automatic Object Identification from System Specification. ISORC 2000: 198-201
13	EE	Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED 2000: 197-
1999
12	EE	Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS 1999: 326-332
11	EE	Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. J. Electronic Testing 14(1-2): 149-158 (1999)
1998
10		Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Carlos Eduardo Pereira: An OO Based Methodology for Real-Time HW/SW Systems Modeling. DIPES 1998: 213-222
9	EE	Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Defect-oriented test quality assessment using fault sampling and simulation. ITC 1998: 35-42
1997
8	EE	Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. DFT 1997: 29-37
1995
7	EE	Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira: Test preparation for high coverage of physical defects in CMOS digital ICs. VTS 1995: 330-337
1994
6		M. Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC 1994: 720-728
1993
5		Antonio Casimiro, M. Simões, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. DFT 1993: 109-116
4		P. Nicolau, J. Barbosa, M. Saraiva, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Analysis of CMOS Analog Building Blocks. DFT 1993: 311-318
1992
3		M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Physical DFT for High Coverage of Realistic Faults. ITC 1992: 642-651
1991
2	EE	João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves: A methodology for testability enhancement at layout level. J. Electronic Testing 1(4): 287-299 (1991)
1990
1	EE	João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves, R. Crespo: A strategy for testability enhancement at layout level. EURO-DAC 1990: 413-417

Coauthor Index

1	C. F. Beltrá Almeida	[1] [2]
2	L. Balado	[27]
3	J. Barbosa	[4]
4	Daniel Barros Jr.	[28]
5	Leandro Buss Becker	[14] [15]
6	P. Bento	[31]
7	M. Calha	[6]
8	Antonio Casimiro	[5]
9	P. Casimiro	[3]
10	R. Crespo	[1]
11	Octávio Páscoa Dias	[10] [11] [13] [14] [15] [20]
12	José M. Fernandes	[26]
13	Joan Figueras	[23] [27]
14	J. Freijedo	[34] [35] [37]
15	Fernando M. Gonçalves	[1] [2] [3] [6] [8] [9] [12] [16] [17] [18] [21] [22] [24] [25]
16	J. Gonçalves	[1] [2]
17	F. Guerreiro	[33]
18	D. Barros Júnior	[29]
19	C. Leong	[31]
20	Hugo Lérias	[19]
21	P. Lousã	[31]
22	João Luz	[19]
23	Salvador Manich	[23] [27]
24	Ana Mendes	[19]
25	Pedro Moura	[19]
26	Peter Muhmenthaler	[20]
27	P. Nicolau	[4]
28	J. Nobre	[31]
29	Carlos Eduardo Pereira	[10] [14] [15] [20]
30	A. Pierce	[33]
31	Paolo Prinetto	[20]
32	W. Radermacher	[20]
33	J. Rego	[31]
34	P. Rodrigues	[31]
35	Juan J. Rodríguez-Andina	[30] [32] [34] [35] [36] [37] [38]
36	M. Rodríguez-Irago	[29] [30] [32]
37	Rosa Rodríguez-Montañés	[23]
38	Marcelino B. Santos	[3] [4] [5] [6] [7] [9] [12] [13] [16] [17] [18] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [33] [34] [35] [37] [38]
39	Marcelino Bicho Dos Santos	[36]
40	M. Saraiva	[3] [4]
41	Jorge Semião	[13] [20] [32] [33] [34] [35] [36] [37] [38]
42	J. C. Silva	[31]
43	M. Simões	[5] [7]
44	José T. de Sousa	[3]
45	João Paulo Teixeira	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38]
46	A. Trindade	[31]
47	J. Varela	[31]
48	Fabian Vargas	[28] [29] [30] [32] [34] [35] [36] [37] [38]
49	Yervant Zorian	[20]